Antenna Systems & Technology - Summer 2014 - (Page 24)

NEW PRODUCTS & SERVICES TEST & MEASUREMENT Agilent Announces Reference Solutions to Speed Test-System Development Agilent Technologies, Inc. has announced the availability of Reference Solutions, a combination of hardware, software and measurement expertise that delivers the essential components of electronic test systems. Reference Solutions also include utilities such as example program source code, highly optimized for specific applications, which show users how to get the most out of their test system. Agilent has shown that Reference Solutions not only enable quick evaluation of a test solution for specific applications but also dramatically reduce the time it takes to integrate a new test system into a test environment. Agilent's first Reference Solution is an RF power amplifier (PA) manufacturing test solution with envelope tracking capability. It includes a graphical user interface program for easy solution evaluation, example source code optimized for speed, extremely fast modulation analysis, and excellent accuracy and measurement repeatability. The RF PA Reference Solution is built around the Agilent M9391A PXIe VSA and the M9381A PXIe VSG. It uses Agilent measurement software that provides consistency with Agilent benchtop signal generation and analysis instruments. The solution delivers high test throughput, reduces cost, and allows for rapid integration into a PA test environment. It supports the testing of devices that use envelope tracking for improved power efficiency by including the Agilent E33522B waveform generator, which is synchronized to the M9381A VSG. The M9391A VSA and the M9381A VSG use hardware-accelerated measurements, combined with Agilent's innovative fast baseband tuning technology, to provide unprecedented servo-loop test times through rapid frequency and amplitude adjustments, enabling test times of less than 300 ms for complete test programs. Leveraging the same user interface and best-in-class measurement IP of the X-Series measurement applications ensures extremely high confidence in measurement results through the entire design and production life cycle. It also allows reuse of existing test code and reduces test development time, facilitating easy migration between test hardware. The Reference Solution includes control of the Agilent N6700B low-profile modular power system mainframe and the Agilent U2004A power sensor, used for loss calibration. Anite Accelerates Lab-Based 4G and 5G Virtual Drive Testing Anite has announced its participation in a project initiated by Intel to develop "virtualized" testing environments in order to accelerate 4G and 5G technology development and testing. Project Virtuoso (Virtualized environment for communication system development and optimization), subsidized by the Danish High Technology Foundation, will run for four years and other partner companies include Telenor and Aalborg University Department of Electronic Systems. Within this project, Anite aims to enhance its Virtual Drive Testing Tools (VDT) to utilize data measured in the field to "virtually" recreate the field test environment in a laboratory. This enables quick, realistic and repeatable benchmarking of devices or base stations as well as simplifying the debugging of errors found in the field. Anite's VDT, based on the Propsim channel emulator, is a performance testing toolset which enables chipset and device manufacturers, as well as operators, to reduce the time and money spent on device design, integration and verification. By improving the feedback loop from final-stage field trials to early-stage design development, the industry is able to accelerate development and launch of new mobile technologies. Anite's radio channel expertise has also been recognised by the METIS project, a consortium of 28 key wireless industry players, which aims to lay the foundation for 5G. Anite was selected in late 2013 to lead the radio channel modelling Task Group within METIS. For more new products visit www.antennasonline.com/main/category/markets/test-measurement 24 Antenna Systems & Technology Summer 2014 www.AntennasOnline.com http://www.antennasonline.com/main/category/markets/test-measurement http://www.AntennasOnline.com

Table of Contents for the Digital Edition of Antenna Systems & Technology - Summer 2014

Editor’s Choice
Optimizing RF Signal Performance to Improve LTE Coverage and Capacity
Managing the Tower Top for LTE Advanced
Connectivity for Internet of Things Success
Capitalizing on Network Architecture Trends
Antennas
Components/Subsystems
Short-Range Wireless
Software / System Design
Test & Measurement
Industry News
Marketplace
Insatiable Hunger Feeds DAS

Antenna Systems & Technology - Summer 2014