Electronics Protection - September/October 2013 - (Page 9)
Feature
Reliability Data
The gasket holder with the DUT in place can be removed and
subjected to accelerated aging to collect reliability data. The SE
data for a gasket before and after 3,000 hours of 85 percent humidity and 85°C and maximum operating temperature (160°C) aging is shown in Figure 3. The SE of a control sample was recorded,
and then it was subjected to accelerated aging and data after
aging was captured.
TEM Cell is the only method that maintains joint surfaces
during aging. Samples for radiated enclosure and transfer impedance measurements are aged un-flanged. SE measurements with
industry standard methods are presented in following section to
equipto earthquake 2010:Layout 1 3/22/10 10:13 AM Page 1
validate TEM cell reliability data.
Please see Laird on page 15
Figure 2. Noise Floor and Reference Measurements
Gasket SE Measurement
Excitation and measurement is performed by
the TEM structures mounted in the GTE. The
measurement is made by taking the ratio of
received energy to the excitation energy. In
particular, the transverse field produced by one
of the TEM horns is incident on the slider, which
also contains the DUT. Depending on the quality of contact between the gasket that is placed
between the slider and the floor of the enclosure,
a measure of the gasket shielding effectiveness is
determined by how much of the transverse field
is transmitted to other TEM structure. The SE is
given in equation (1), where Einc is the incident
wave, and Etr is the transmitted electromagnetic
wave. The enclosure is a resonant cavity and TE
and TM mode artefacts are significant and limit
the useful frequency range to 2 GHz, though there
may be ways to extend this in future.
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The shielding effectiveness of a gasket is determined by subtracting the measured insertion
loss with the gasket in place from the reference
measurement by utilizing formula (2).
A 25 percent constant compression is applied
uniformly for SE measurements on the DUT. The
test gasket initial SE is captured and the DUT
removed for accelerated aging without altering the
initial compression.
Figure 3. Reliability data of a test gasket with TEM Cell
800-204-7225 • 630-859-7840 • www.equiptoelec.com
sales@equiptoelec.com • Aurora, IL 60506
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Proven tough during the Chilean earthquakes
September/October 2013
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Table of Contents for the Digital Edition of Electronics Protection - September/October 2013
Geist Unveils Rapid Deployment Data Center Environmental Monitoring System
Enabling Effective Thermal Management with DCIM
Predicting Gasket Performance: SE Measurements with a TEM Cell to Study Gasket Reliability
Rack Containment 101
The Nine Core Elements of DCIM
Using Electronic Locking Solutions to Secure Enclosures and Meet Storage Compliance Needs
Hammond’s HJ Series Ticks All the Boxes
Rogers Introduces Poron SlimGrip Foam
Ferrite Suppressors Clear Interference
Fujipoly Thermal Sheets are a Cooling Influence on LED Lighting
GE Introduces TLE Series UPS Platform
Gore PolyVent XL Improves Reliability of Large Outdoor Enclosures
IMI Sensors Launches Linear Adjust Mechanical Vibration Switch
Industry News
Calendar of Events
Five Ways to Realize Server Room Profitability
Electronics Protection - September/October 2013
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