EDNE June 2012 - (Page 1)

Tales from the Cube Pg 60 JUNE Issue 06/2012 www.edn-europe.com EDn.Comment Pg 09 Baker’s Best: EmI problems? Part three Pg 31 Design Ideas Pg 53 Voice THE ENGINEER VOICE OF of the engineer BEYonD smarTPhonEs Page 32 ConTroLLEr ICs TakE muLTITouCh sCrEEns Test-driven development for embedded C: Why debug? Page 26 Pico-projector design uses color LEDs Page 41 Digital isolation in smart energy metering applications Page 46 http://www.edn-europe.com

Table of Contents for the Digital Edition of EDNE June 2012

Cover
Agilent Technologies
Contents
International Rectifier
RS Components
Masthead
International Rectifier
Comment
Pulse
Analog Devices
Digi-Key
Farnell
NXP
Test & Measurement
Silicon Labs
Digi-Key
Test-driven development for embedded C: why debug?
Digi-Key
Baker’s best
Cover story
Rohde & Schwarz
Rohde & Schwarz
Rohde & Schwarz
Rohde & Schwarz
Rohde & Schwarz
Pico-projector design uses color LEDs
Digital isolation in smart energy metering applications
Mechatronics in design
Teardown
Design Idea
Product Roundup
Tales from the cube

EDNE June 2012

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