Instrumentation & Measurement Magazine 23-2 - 115

newproducts
Robert Goldberg

Please send all "New Products" information to:
Robert M. Goldberg
1360 Clifton Ave.
PMB 336
Clifton, NJ 07012 USA
e-mail: r.goldberg@ieee.org

Arbitrary Waveform
Generators Deliver Output
Swings up to 24 V
Spectrum Instrumentation has added six new
Arbitrary Waveform Generators (AWGs) to
its recently released M2p.65 xx series of PCIe
cards. The new AWGs extend the product
families' capabilities by boosting the available output range, so that waveforms can be
generated with amplitude swings of up to
±12 V into 1 MΩ or ±6 V into 50 Ω. To achieve
the higher output voltage ranges, the cards have been fitted
with additional amplification and larger cooling plates. This
makes the cards a little wider, so that they occupy two PCIe
slots, but they are still just 168 mm in length. The small size allows them to fit into almost any PC, turning it into a powerful
and flexible waveform generator.
The M2p.65xx series AWGs use the latest 16-bit Digital-toAnalog Converters and feature a fast PCIe x4 interface with up
to 700 MByte/s streaming speed. Users can select output speed
rates of either 40 MS/s (M2p.654x series) or 125 MS/s (M2p.657x
series) and models with one, two or four channels per card.
Each channel features its own DAC and output stage.
Multi-channel cards share a common clock and trigger to ensure full synchronization, and the output stages incorporate
four switchable filter paths to help optimize signal quality. The
flexible output stages combine with the high resolution 16-bit
DACs to enable the generation of signals with very
low distortion, exceptional
dynamic range and a high
signal-to-noise ratio.
To allow the M2p.65xx
series AWGs to generate
long and complex waveforms, each card comes
April 2020

equipped with 512 MSamples of on-board memory. The large
memory is complemented by a variety of different output
modes. For example, the memory can be segmented and waveforms can be created by looping on, and switching between,
different segments. This flexibility allows users to create ultra-long, single shot waveforms or constantly changing,
burst-type signals such as those found in communications, radar, ultrasound, LIDAR or sonar systems.
SBench 6 enables the user to control all of the modes and
settings of the AWG via a simple, easy-to-use, interface. The
software is designed to support multi-channel operation and
has a host of built-in features for waveform display, signal generation, data analysis and documentation. Basic signals can be
created using the software's EasyGenerator function that produces waveforms like sine waves, triangles or rectangles with
programmable frequency, amplitude and phase. More complex signals can be created using mathematical equations or
imported from other programs or devices (such as digitizers or
oscilloscopes) using Binary, ASCII, or Wave formats.
More information about Spectrum can be found at http://
www.spectrum-instrumentation.com.

Source Measurement Unit Modules
Solve Tough Test Challenges Involving
Low Current, High Capacitance
Tektronix, Inc. has announced the availability
of two new source measure unit (SMU) modules
for the Keithley 4200A-SCS
Parameter Analyzer that
can perform low-current
measurements, even in the
presence of high load capacitance due to long cables and complex test setups. Among the notable test applications facing
this challenge are LCD display manufacturing and nano FET
device testing on a chuck.
The new 4201-SMU and 4211-SMU are designed specifically for test setups with long cables, switch matrices, gate
contacts to the chuck, and other fixturing. Such test setups,
which are required in several low current measurement applications, can increase the capacitance seen at the output of the
SMU, even though the device under test itself has very low capacitance. When the test connection capacitance is too high,
the resulting low current measurements can become unstable.

IEEE Instrumentation & Measurement Magazine 115

http://www.spectrum-instrumentation.com http://www.spectrum-instrumentation.com

Instrumentation & Measurement Magazine 23-2

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