Instrumentation & Measurement Magazine 23-2 - 21

I&M Applications for
Educational Purposes
Raul Ionel, Septimiu Mischie, Daniel Belega,
Liliana Mât¸iu-Iovan, and Ciprian Dughir

T

eaching activities in the Instrumentation and Measurement (I&M) field, for both undergraduate and
postgraduate students in the engineering domains,
should be correlated with the industry requirements [1]-[3]. In
this way, students can understand actual industry needs and gain
skills in solving I&M problems occurring in associated activities.
At the University Politehnica of Timis¸oara, Romania,
teaching activities in the I&M field are performed by the Department of Measurements and Optical Electronics from the
Faculty of Electronics, Telecommunications and Informational
Technologies.
This paper describes four recently developed applications
dealing with important aspects in modern electrical and electronics measurements. They are used to support teaching
activities with third- and fourth-year undergraduate students
following their specialization in Applied Electronics (AE) and
with first-year postgraduate students enrolled in the Electronic Intelligent Systems (EIS) specialization. Furthermore,
they are relevant in the context of "Industry 4.0" requirements
because our students should be educated to expand their
knowledge and gain experience by working with recent, specialized circuits, methodologies and technologies.
The first application deals with the topic of Boundary Scan
Test (BST) enhanced by frequency and voltage measurements.
It shows how different I&M tools can be combined in order to
extend circuit analysis coverage. The second application presents an integration between an inductance (L), capacitance (C),
and resistance (R) (LCR) meter and a Flying Probe (FP) equipment, developed to improve measurements accuracy. The next
application is focused on the online visualization versus time of
the measurement results provided by a movement MicroElectroMechanical Sensors (MEMS). The fourth application is the
phasor measurements of single phase power voltages by means
of an accurate algorithm based on the dynamic phasor model.

trend causes the integration of more and more circuits on a
smaller PCB area. Consequently, engineers are challenged to
adapt I&M techniques to customer requirements, considering
more and more I/O pins, less inter-pin spacing or sometimes
no access to inner pins.
In the 1990s, the Joint Test Action Group (JTAG), initiated
by important electronics manufacturers in 1985, proposed the
IEEE Standard 1149.1 for Test Access Port and Boundary-Scan
Architecture [4]. This Standard sets the rules and procedures
required for the implementation of BST.
This procedure represents a non-invasive interaction test
which allows an evaluation of Devices Under Test (DUTs)
structural integrity [5], [6].

Educational Objectives

Enhanced Boundary Scan Test Application

The goal of this application is to familiarize fourth-year AE
students with the principles of BST by demonstrating how its
capabilities can be augmented using automated interaction
with a dedicated measurement device. These activities are performed in the second semester as undergraduate dissertations.
Attendees (usually three to five students) are required to have
good background in circuit design, analog electronics, measurement fundamentals, and LabVIEWTM programming. After
seven weeks of combined theoretical and hands-on learning,
the following skills were assessed:
◗◗ Understanding the purpose of BST, its advantages and challenges as compared with other industrial test technologies;
◗◗ Understanding the design guidelines and requirements
for IEEE Standard 1149.1 enabled electronic boards;
◗◗ Ability to design, build, and verify a simple electronic
board using dedicated industrial tools;
◗◗ Ability to implement a functional BST project and present
initial coverage analysis data;
◗◗ Development of a complete test system based on
LabVIEWTM, which includes extended test coverage and
additional measurement tools.

The Principle of Boundary Scan Testing

Description of Laboratory Equipment

Many electronic devices used in engineering applications incorporate complex functions into reduced package sizes. This

The LabVIEWTM environment is used for final test implementation together with the Analog Discovery Toolkit and the

April 2020	

IEEE Instrumentation & Measurement Magazine	21
1094-6969/20/$25.00©2020IEEE



Instrumentation & Measurement Magazine 23-2

Table of Contents for the Digital Edition of Instrumentation & Measurement Magazine 23-2

No label
Instrumentation & Measurement Magazine 23-2 - No label
Instrumentation & Measurement Magazine 23-2 - Cover2
Instrumentation & Measurement Magazine 23-2 - 1
Instrumentation & Measurement Magazine 23-2 - 2
Instrumentation & Measurement Magazine 23-2 - 3
Instrumentation & Measurement Magazine 23-2 - 4
Instrumentation & Measurement Magazine 23-2 - 5
Instrumentation & Measurement Magazine 23-2 - 6
Instrumentation & Measurement Magazine 23-2 - 7
Instrumentation & Measurement Magazine 23-2 - 8
Instrumentation & Measurement Magazine 23-2 - 9
Instrumentation & Measurement Magazine 23-2 - 10
Instrumentation & Measurement Magazine 23-2 - 11
Instrumentation & Measurement Magazine 23-2 - 12
Instrumentation & Measurement Magazine 23-2 - 13
Instrumentation & Measurement Magazine 23-2 - 14
Instrumentation & Measurement Magazine 23-2 - 15
Instrumentation & Measurement Magazine 23-2 - 16
Instrumentation & Measurement Magazine 23-2 - 17
Instrumentation & Measurement Magazine 23-2 - 18
Instrumentation & Measurement Magazine 23-2 - 19
Instrumentation & Measurement Magazine 23-2 - 20
Instrumentation & Measurement Magazine 23-2 - 21
Instrumentation & Measurement Magazine 23-2 - 22
Instrumentation & Measurement Magazine 23-2 - 23
Instrumentation & Measurement Magazine 23-2 - 24
Instrumentation & Measurement Magazine 23-2 - 25
Instrumentation & Measurement Magazine 23-2 - 26
Instrumentation & Measurement Magazine 23-2 - 27
Instrumentation & Measurement Magazine 23-2 - 28
Instrumentation & Measurement Magazine 23-2 - 29
Instrumentation & Measurement Magazine 23-2 - 30
Instrumentation & Measurement Magazine 23-2 - 31
Instrumentation & Measurement Magazine 23-2 - 32
Instrumentation & Measurement Magazine 23-2 - 33
Instrumentation & Measurement Magazine 23-2 - 34
Instrumentation & Measurement Magazine 23-2 - 35
Instrumentation & Measurement Magazine 23-2 - 36
Instrumentation & Measurement Magazine 23-2 - 37
Instrumentation & Measurement Magazine 23-2 - 38
Instrumentation & Measurement Magazine 23-2 - 39
Instrumentation & Measurement Magazine 23-2 - 40
Instrumentation & Measurement Magazine 23-2 - 41
Instrumentation & Measurement Magazine 23-2 - 42
Instrumentation & Measurement Magazine 23-2 - 43
Instrumentation & Measurement Magazine 23-2 - 44
Instrumentation & Measurement Magazine 23-2 - 45
Instrumentation & Measurement Magazine 23-2 - 46
Instrumentation & Measurement Magazine 23-2 - 47
Instrumentation & Measurement Magazine 23-2 - 48
Instrumentation & Measurement Magazine 23-2 - 49
Instrumentation & Measurement Magazine 23-2 - 50
Instrumentation & Measurement Magazine 23-2 - 51
Instrumentation & Measurement Magazine 23-2 - 52
Instrumentation & Measurement Magazine 23-2 - 53
Instrumentation & Measurement Magazine 23-2 - 54
Instrumentation & Measurement Magazine 23-2 - 55
Instrumentation & Measurement Magazine 23-2 - 56
Instrumentation & Measurement Magazine 23-2 - 57
Instrumentation & Measurement Magazine 23-2 - 58
Instrumentation & Measurement Magazine 23-2 - 59
Instrumentation & Measurement Magazine 23-2 - 60
Instrumentation & Measurement Magazine 23-2 - 61
Instrumentation & Measurement Magazine 23-2 - 62
Instrumentation & Measurement Magazine 23-2 - 63
Instrumentation & Measurement Magazine 23-2 - 64
Instrumentation & Measurement Magazine 23-2 - 65
Instrumentation & Measurement Magazine 23-2 - 66
Instrumentation & Measurement Magazine 23-2 - 67
Instrumentation & Measurement Magazine 23-2 - 68
Instrumentation & Measurement Magazine 23-2 - 69
Instrumentation & Measurement Magazine 23-2 - 70
Instrumentation & Measurement Magazine 23-2 - 71
Instrumentation & Measurement Magazine 23-2 - 72
Instrumentation & Measurement Magazine 23-2 - 73
Instrumentation & Measurement Magazine 23-2 - 74
Instrumentation & Measurement Magazine 23-2 - 75
Instrumentation & Measurement Magazine 23-2 - 76
Instrumentation & Measurement Magazine 23-2 - 77
Instrumentation & Measurement Magazine 23-2 - 78
Instrumentation & Measurement Magazine 23-2 - 79
Instrumentation & Measurement Magazine 23-2 - 80
Instrumentation & Measurement Magazine 23-2 - 81
Instrumentation & Measurement Magazine 23-2 - 82
Instrumentation & Measurement Magazine 23-2 - 83
Instrumentation & Measurement Magazine 23-2 - 84
Instrumentation & Measurement Magazine 23-2 - 85
Instrumentation & Measurement Magazine 23-2 - 86
Instrumentation & Measurement Magazine 23-2 - 87
Instrumentation & Measurement Magazine 23-2 - 88
Instrumentation & Measurement Magazine 23-2 - 89
Instrumentation & Measurement Magazine 23-2 - 90
Instrumentation & Measurement Magazine 23-2 - 91
Instrumentation & Measurement Magazine 23-2 - 92
Instrumentation & Measurement Magazine 23-2 - 93
Instrumentation & Measurement Magazine 23-2 - 94
Instrumentation & Measurement Magazine 23-2 - 95
Instrumentation & Measurement Magazine 23-2 - 96
Instrumentation & Measurement Magazine 23-2 - 97
Instrumentation & Measurement Magazine 23-2 - 98
Instrumentation & Measurement Magazine 23-2 - 99
Instrumentation & Measurement Magazine 23-2 - 100
Instrumentation & Measurement Magazine 23-2 - 101
Instrumentation & Measurement Magazine 23-2 - 102
Instrumentation & Measurement Magazine 23-2 - 103
Instrumentation & Measurement Magazine 23-2 - 104
Instrumentation & Measurement Magazine 23-2 - 105
Instrumentation & Measurement Magazine 23-2 - 106
Instrumentation & Measurement Magazine 23-2 - 107
Instrumentation & Measurement Magazine 23-2 - 108
Instrumentation & Measurement Magazine 23-2 - 109
Instrumentation & Measurement Magazine 23-2 - 110
Instrumentation & Measurement Magazine 23-2 - 111
Instrumentation & Measurement Magazine 23-2 - 112
Instrumentation & Measurement Magazine 23-2 - 113
Instrumentation & Measurement Magazine 23-2 - 114
Instrumentation & Measurement Magazine 23-2 - 115
Instrumentation & Measurement Magazine 23-2 - 116
Instrumentation & Measurement Magazine 23-2 - 117
Instrumentation & Measurement Magazine 23-2 - 118
Instrumentation & Measurement Magazine 23-2 - 119
Instrumentation & Measurement Magazine 23-2 - 120
Instrumentation & Measurement Magazine 23-2 - Cover3
Instrumentation & Measurement Magazine 23-2 - Cover4
https://www.nxtbook.com/allen/iamm/24-6
https://www.nxtbook.com/allen/iamm/24-5
https://www.nxtbook.com/allen/iamm/24-4
https://www.nxtbook.com/allen/iamm/24-3
https://www.nxtbook.com/allen/iamm/24-2
https://www.nxtbook.com/allen/iamm/24-1
https://www.nxtbook.com/allen/iamm/23-9
https://www.nxtbook.com/allen/iamm/23-8
https://www.nxtbook.com/allen/iamm/23-6
https://www.nxtbook.com/allen/iamm/23-5
https://www.nxtbook.com/allen/iamm/23-2
https://www.nxtbook.com/allen/iamm/23-3
https://www.nxtbook.com/allen/iamm/23-4
https://www.nxtbookmedia.com