Instrumentation & Measurement Magazine 23-2 - 22

XJTAG Integration Examples package. The OrCAD Lite software is used for circuit design and the XJTAG DFT Assistant
for OrCAD plugin is added for IEEE Standard 1149.1-2013
compliance verification and validation. To create the BST programs, XJDeveloper [7], which is a state-of-the-art software, is
employed.
The main hardware components are the XJLink2 controller
from XJTAG and the Digilent Analog Discovery 2 (AD2) from
Digilent. The XJLink2 performs the main BST procedures defined via XJDeveloper, while the AD2 is used for frequency
and voltage measurements.

Description of the Application
The student application should demonstrate how test capabilities of the basic BST can be extended by automated interaction
with an external dedicated device which performs additional
measurement procedures. The extended capabilities include
DUT connector functionality validation and voltage and frequency measurements. The performed activities are focused
on test and measurement procedures development and not on
providing a DUT with specific functionality.

Simulation Work
A DUT which includes three ATMEGA16A micro-controllers
was designed by OrCAD Lite. Three separate boundary scan
chains were defined instead of a single chain including all MicroControllers Units (MCUs). It is worth noting that this is a
common schematics setup in industrial projects [5], [6]. Additionally, oscillators, logic components, transistors, LEDs,
buzzers, jumpers, diodes, and connectors were included. Next
the XJTAG DFT Assistant was used to verify the Test Access
Port (TAP) Connections, TAP Terminations, and Compliance
Pins (Fig. 1).
Starting from the verified schematics, one of the Assistant
features allows the user to automatically generate a basic BST
project. XJDeveloper was used to further add testing capabilities. For the considered schematics, by using XJDeveloper, an
initial coverage report was obtained. It was about 60% - 65%.
Up to this point all board details were simulated.

Experimental Work

Fig. 2. Experimental setup: DUT, XJLink2 controller, AD2, external power
supply, and BST test and measurement program developed by students.

the MCUs IDs, performing buzzer tests, and performing LEDs
tests by various ways of illumination or shorts and opens tests
(Connection test). Hardware simulations of design errors and
fault investigations were analyzed by physically connecting/
disconnecting different nets.
To extend the BST performance, the AD2 was included as a
separate tool, connected to the DUT together with the XJLink2
controller (Fig. 2). A LabVIEWTM application was implemented
to perform the BST procedure using the project generated by
XJDeveloper. The same application will call custom defined
XJTAG project functions, which set values of High and Low
levels on accessible nets corresponding to the DUT connector
pins. The AD2 is externally connected to those pins and controlled to measure nets values. If the read values correspond to
what was set on those nets, it means that the connector functionality was validated, and the overall test efficiency has
increased. Finally, the AD2 is used to perform voltage and
frequency measurements on different connector pins. At the
software level, the communication between the AD2 and the
XJTAG project is mastered by the LabVIEWTM application. The
protocol implies data exchange over an available emulated serial connection. The improved test coverage was higher than
70%. The processing times required by different routines are
reported in Table 1.

Next steps include the DUT building and testing. The test procedure includes checking the chains for integrity and reading

Table 1 - Processing times required
by different routines
Routine

Fig. 1. DUT design developed in OrCAD Lite and validated by XJTAG DFT
Assistant plugin.
22	

Time (s)

Chains and IDs validation

1.9

Circuitry integrity (short, open, stuck at)

1.7

Customized buzzer test

3.0

LEDs (different illumination scenarios)

9.4

Voltage and frequency measurements

1.4

Oscillator tests

0.2

Extended connectors test

IEEE Instrumentation & Measurement Magazine	

22.0
April 2020



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