Instrumentation & Measurement Magazine 23-3 - 7

strain on resources like silicon and copper used to make electronics. Thus, while these Trends of Choice can enable I&M to
become more prevalent, they also facilitate the need for our instrumentation and devices to be more sustainable.
As we have seen, I&M can enable sustainable practices like
more efficient management of utilities. It can also help by allowing more efficient renewable energy systems and food
production [82], [83]. The question then becomes: Is this a
one-to-one trade? Are we doing the environment enough of
a favor through these sustainable practices to offset the harm
that is being done by introducing more and more devices into
our "ecosystem?" Rather, should the focus be placed on creating fewer devices that are more adaptable and do more rather
than simply introducing more devices? It is for this reason that
both sustainability and adaptability are two necessary issues
that moving forward will need to be considered more in the
field of I&M.
As technology is constantly evolving, so are the trends that
have been discussed. New discoveries and innovations could
quickly disrupt current trends and introduce others. What
trends actually will dominate the field of I&M in the years to
come are unknown.

[9]	 V. Govindaraju and G. Palanisamy, "Need of robotic systems in
non-destructive testing applications," presented at NDE 2017
Conf. & Exhibition of the Indian Soc. for NDT (ISNT), 2017.
[10]	C. Mineo, D. Herbert, M. Morozov, S. Pierce, I. Nicholson, and I.
Cooper, Robotic Non-Destructive Inspection, 2012.
[11]	V. Scotti, "Can instruments replace humans also as liable
entities?" Legal Metrology, IEEE Instrum. Meas. Mag., vol. 18, no.
5, pp. 11-12, 2015.
[12]	S. K. Moore, "EUV lithography finally ready for chip
manufacturing," 2018, IEEE Spectrum. [Online]. Available:
https://spectrum.ieee.org/semiconductors/nanotechnology/
euv-lithography-finally-ready-for-chip-manufacturing.
[13]	S. K. Moore, "GlobalFoundries CTO on why the company
abandoned the 'Bleeding Edge,' 2018, IEEE Spectrum.
[Online]. Available: https://spectrum.ieee.org/nanoclast/
semiconductors/nanotechnology/globalfoundries-cto-on-whythe-company-abandoned-the-bleeding-edge.
[14]	"Instrumentation and Metrology for Nanotechnology," Nanoscale
Science, Engineering, and Technology Subcommittee of the
National Science and Technology Council, 2004.
[15]	U. Sharma and X. Wei, "Fiber Optic Interferometric Devices," in
Fiber Optic Sensing and Imaging. New York, NY, USA: Springer
Science+Business Media, 2013.

Acknowledgments

[16]	W. D. Heacox and P. Connes, "Optical fibers in astronomical

Special thanks to Elliott Cramer (NASA Langley) and Lee Barford (Keysight Technologies) for providing valuable insight
that aided in the development of this article.

[17]	L. Wang and N. Fang, "Applications of fiber-optic interferometry

References

[18]	Z. Xu, H. Zhang, K. Chen, and S. Pan, "Compact all-fiber

instruments," The Astronomy and Astrophysics Review, vol. 3, no. 3,
pp. 169-199, 1992.
technology in sensor fields," Intech, ch. 7, 2017.

[1]	 "Reshaping the Future: Unlocking Automation's Untapped
Value," Capgemini Research Institute, 2018.
[2]	 S. R. Panigrahi, N. Björsell, and M. Bengtsson, "Distributed
detection with non-identical wireless sensors for industrial
applications," in Proc. 2019 IEEE Int. Conf. Industrial Technol.
(ICIT), pp. 1403-1408, 2019.

polarization coherent lidar based on a polarization modulator,"
IEEE Trans. Instrum. Meas., p. 1, 2019.
[19]	H. Hu, F. Xia, Y. Zhang, and H. Gao, "Two-dimensional vector
micro-displacement measurement based on fiber mode
demodulation technology," IEEE Trans. Instrum. Meas., p. 1, 2019.
[20]	J. Huang, D. T. Pham, C. Ji, and Z. Zhou, "Smart cutting

[3]	 S. Lu, R. Yan, Y. Liu, and Q. Wang, "Tacholess speed estimation
in order tracking: a review with application to rotating machine
fault diagnosis," IEEE Trans. Instrum. Meas., vol. 68, no. 7, pp.
2315-2332, 2019.

tool integrated with optical fibre sensors for cutting force
measurement in turning," IEEE Trans. Instrum. Meas., p. 1, 2019.
[21]	E. Fujiwara, T. S. Delfino, T. D. Cabral, and C. M. B. Cordeiro,
"All-optical fiber anemometer based on the pitot-static tube,"

[4]	 J. Guo, S. Lu, C. Zhai, and Q. He, "Automatic bearing fault
diagnosis of permanent magnet synchronous generators in wind

IEEE Trans. Instrum. Meas., p. 1, 2019.
[22]	T. Addabbo, A. Fort, M. Mugaini, L. Parri et al., "On the suitability

turbines subjected to noise interference," Meas. Sci. Technol., vol.

of low-cost compact instrumentation for blood impedance

29, no. 2, p. 025002, 2018.

measurements," IEEE Trans. Instrum. Meas., vol. 68, no. 7, pp.

[5]	 J. Ding, L. Li, H. Peng, and Y. Zhang, "A rule-based cooperative
merging strategy for connected and automated vehicles," IEEE
Trans. Intelligent Transportation Syst., pp. 1-11, 2019.
[6]	 H. S. Ramadan, M. Becherif, and F. Claude, "Energy management
improvement of hybrid electric vehicles via combined GPS/rulebased methodology," IEEE Trans. Automation Sci. Eng., vol. 14, no.
2, pp. 586-597, 2017.

2412-2424, 2019.
[23]	M. Fajkus, J. Nedoma, R. Martinek, J. Brablik et al., "MR fullycompatible and safe FBG breathing sensor: a practical solution for
respiratory triggering," IEEE Access, p. 1, 2019.
[24]	L. Zou, C. McLeod, and M. R. Bahmanyar, "Wireless interrogation of
implantable SAW sensors," IEEE Trans. Biomedical Eng., Aug. 2019.
[25]	K. Unda, A. Mohammadkhah, K. Lee, D. E. Day, M. J. O. Keefe,

[7]	 L. Yu and C. A. C. Leckey, "Lamb wave-based quantitative crack
detection using a focusing array algorithm," J. Intelligent Material
Sys. Structures, vol. 24, no. 9, pp. 1138-1152, 2013.
[8]	 D. T. Delelegn, "Non-Destructive Evaluation for Composite

and C. Kim, "Sensor substrates based on biodegradable glass
materials," in Proc. 2016 IEEE SENSORS, pp. 1-3, 2016.
[26]	P. Mayer, M. Magno, and L. Benini, "Self-sustaining acoustic
sensor with programmable pattern recognition for underwater

Material," Thesis for Master of Science degree, Old Dominion

monitoring," IEEE Trans. Instrum. Meas., vol. 68, no. 7, pp. 2346-

University, 2018.

2355, 2019.

May 2020	

IEEE Instrumentation & Measurement Magazine	7


https://spectrum.ieee.org/semiconductors/nanotechnology/euv-lithography-finally-ready-for-chip-manufacturing https://spectrum.ieee.org/semiconductors/nanotechnology/euv-lithography-finally-ready-for-chip-manufacturing https://spectrum.ieee.org/nanoclast/semiconductors/nanotechnology/globalfoundries-cto-on-why-the-company-abandoned-the-bleeding-edge https://spectrum.ieee.org/nanoclast/semiconductors/nanotechnology/globalfoundries-cto-on-why-the-company-abandoned-the-bleeding-edge https://spectrum.ieee.org/nanoclast/semiconductors/nanotechnology/globalfoundries-cto-on-why-the-company-abandoned-the-bleeding-edge

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