Instrumentation & Measurement Magazine 23-3 - 9

[59]	S. Khan, L. Lorenzelli, and R. S. Dahiya, "Technologies for
printing sensors and electronics over large flexible substrates: a
review," IEEE Sensors J., vol. 15, no. 6, pp. 3164-3185, 2015.
[60]	B. K. Tehrani, B. S. Cook, and M. M. Tentzeris, "Inkjet-printed 3D
interconnects for millimeter-wave system-on-package solutions,"
in Proc. 2016 IEEE MTT-S Int. Microwave Symp. (IMS), pp. 1-4,

principles," IEEE Instrum. Meas. Mag., vol. 20, no. 1, pp. 15-19,
2017.
[75]	A. Badnjevic´ , L. Gurbeta, D. Boškovic´ , and Z. Džemic´ , "Medical
devices in legal metrology," in Proc. 2015 4th Mediterranean Conf.
Embedded Computing (MECO), pp. 365-367, 2015.
[76]	A. Ferrero, "DNA profiling: a metrological and signal processing
perspective," IEEE Instrum. Meas. Mag., vol. 20, no. 1, pp. 4-7,

2016.
[61]	C. Sternkiker, E. Sowade, K. Y. Mitra, R. Zichner, and R. R.

2017.

Baumann, "Upscaling of the inkjet printing process for the

[77]	A. Ferrero and V. Scotti, "The story of the right measurement that

manufacturing of passive electronic devices," IEEE Trans.

caused injustice and the wrong measurement that did justice:

Electron. Devices, vol. 63, no. 1, pp. 426-431, 2016.

how to explain the importance of metrology to lawyers and

[62]	L. J. Koerner, T. A. Caswell, D. B. Allan, and S. I. Campbell,
"A python instrument control and data acquisition suite for
reproducible research," IEEE Trans. Instrum. Meas., pp. 1-1, 2019.

judges," Legal Metrology, IEEE Instrum. Meas. Mag., vol. 18, no. 6,
pp. 18-19, 2015.
[78]	K. Hao, "This is how AI bias really happens-and why it's so hard

[63]	P. Russom, "Managing Big Data," TDWI Research, 2013.

to fix," MIT Technology Review, Feb. 2019. [Online]. Available:

[64]	M. Somers, "Managing and visualizing big data," MIT

https://www.technologyreview.com/s/612876/this-is-how-ai-

Management, Sloan School, Nov. 2018. [Online]. Available:
https://mitsloan.mit.edu/ideas-made-to-matter/managing-

bias-really-happensand-why-its-so-hard-to-fix/.
[79]	S. Eustace, "Technology-induced bias in the theory of evidencebased medicine," J. Evaluation in Clinical Practice, vol. 24, no. 5,

and-visualizing-big-data.
[65]	L. Mari and D. Petri, "The metrological culture in the context

2018.

of big data: managing data-driven decision confidence," IEEE

[80]	T. Gebru et al., "Datasheets for Datasets," 2019.

Instrum. Meas. Mag., vol. 20, no. 5, pp. 4-20, 2017.

[81]	L. Kang, J. Bo, L. Hongwei, and L. Siyuan, "Reinforcement

[66]	V. Scotti, "Big data or big (privacy) problem?" IEEE Instrum. Meas.

learning based anti-jamming frequency hopping strategies design
for cognitive radar," in Proc. 2018 IEEE Int. Conf. Signal Processing,

Mag., vol. 20, no. 5, pp. 23-26, 2017.
[67]	J. Iqbal, M. T. Lazarescu, O. B. Tariq, A. Arif, and L. Lavagno,
"Capacitive sensor for tagless remote human identification using
body frequency absorption signatures," IEEE Trans. Instrum.

Commun. Computing (ICSPCC), pp. 1-5, 2018.
[82]	C. B. Singh and J. M. Fielke, "Recent developments in stored grain
sensors, monitoring and management technology," IEEE Instrum.
Meas. Mag., vol. 20, no. 3, pp. 32-55, 2017.

Meas., vol. 67, no. 4, pp. 789-797, 2018.
[68]	A. A. Altahir et al., "Visual sensor placement based on risk maps,"

[83]	T. Addabbo et al., "Instantaneous rotation speed measurement
system based on variable reluctance sensors for torsional

IEEE Trans. Instrum. Meas., pp. 1-1, 2019.
[69]	B. Chao, C. Durso, I. Farrell, and C. Robertson, "Why courts fail
to protect privacy: race, age, bias, and technology," California Law

vibration monitoring," IEEE Trans. Instrum. Meas., vol. 68, no. 7,
pp. 2363-2373, 2019.

Rev., vol. 106, 2018.
[70]	P. E. Agre and M. Rotenberg, "Technology and Privacy: The New
Landscape," MIT Press, 1997. [Online]. Available: https://pages.
gseis.ucla.edu/faculty/agre/landscape.html.
[71]	C. DeCusatis, R. M. Lynch, W. Kluge, J. Houston, P. Wojciak, and
S. Guendert, "Impact of cyberattacks on precision time protocol,"
IEEE Trans. Instrum. Meas., pp. 1-1, 2019.
[72]	E. Waltz, "Can 'internet-of-body' thwart cyber attacks on

Katelyn Brinker (brinker@iastate.edu) is a Ph.D. student in
electrical and computer engineering at Iowa State University,
Ames, Iowa and is supported by a NASA Space Technology Research Fellowship. She served as the Undergraduate
Student Representative from 2016-2018 and is currently the
Graduate Student Representative of the IEEE Instrumentation
& Measurement Society.

implanted medical devices?" Mar. 2019. [Online]. Available:
https://spectrum.ieee.org/the-human-os/biomedical/devices/
thwart-cyber-attacks-on-implanted-medical-devices.
[73]	A. Pérez-Resa, M. Garcia-Bosque, C. Sánchez-Azqueta, and S.
Celma, "Chaotic encryption applied to optical ethernet in industrial
control systems," IEEE Trans. Instrum. Meas., pp. 1-11, 2019.
[74]	H. Swofford and T. Vosk, "Metrology applied to forensic pattern
evidence domains-a call for more forensic science metrology

May 2020	

Reza Zoughi is the Kirby Gray (Battelle) Chair in Engineering
and a Professor Electrical and Computer Engineering at Iowa
State University (ISU), Ames, Iowa. He is also the Director of
Center for Nondestructive Evaluation at ISU. He served as the
IEEE Instrumentation & Measurement Society President from
2014-2015 and as the Editor-in-Chief of the IEEE Transactions
on Instrumentation and Measurement from 2007-2011.

IEEE Instrumentation & Measurement Magazine	9


https://www.technologyreview.com/s/612876/this-is-how-ai-bias-really-happensand-why-its-so-hard-to-fix/ https://www.technologyreview.com/s/612876/this-is-how-ai-bias-really-happensand-why-its-so-hard-to-fix/ https://mitsloan.mit.edu/ideas-made-to-matter/managing-and-visualizing-big-data https://mitsloan.mit.edu/ideas-made-to-matter/managing-and-visualizing-big-data https://pages.gseis.ucla.edu/faculty/agre/landscape.html https://pages.gseis.ucla.edu/faculty/agre/landscape.html https://spectrum.ieee.org/the-human-os/biomedical/devices/thwart-cyber-attacks-on-implanted-medical-devices https://spectrum.ieee.org/the-human-os/biomedical/devices/thwart-cyber-attacks-on-implanted-medical-devices

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