Instrumentation & Measurement Magazine 23-8 - 1

contents
table of

November 2020 VOL. 23, NO. 8

Instrumentation
& Measurement
I&M society web site

features
	

http://imm.ieee-ims.org

4

Impedance Spectroscopy: From Laboratory	
Instrumentation to Field Sensors

I&M magazine web site

-Olfa Kanoun

http://ieee-ims.org/publications/im-magazine

editor-in-chief

Bruno Andò
Associate Professor
DIEEI - University of Catania
Catania, Italy
bruno.ando@unict.it

	

8

The Documentary Standards of the	
IEEE Technical Committee 10
-Sergio Rapuano, John Jendzurski, Luca De Vito, Steven J. Tilden,
William B. Boyer, and Nicholas G. Paulter, Jr.

associate editor-in-chief
Wendy Van Moer
wendy.w.vanmoer@ieee.org

	

TC-13 -Wireless and Telecommunications in	
Measurements- in Action

senior editorial assistant

-Octavian Postolache and Octavia A. Dobre

Kristy Virostek
virostek5@verizon.net

I&M editorial board

	

Bruno Andò
Wendy Van Moer
Max Cortner
Salvo Baglio
Shervin Shirmohammadi
Mark Yeary
Kristen Donnell
Ruqiang Yan
Chi Hung Hwang
Veronica Scotti
Charles Nader
Lee Barford
Kevin Bennet
Richard Davis

Polarimetric Dynamic Vision Sensor p(DVS) Principles	

	 Needing Measurements and Instrumentation within the	
Nanotechnology World: IEEE IMS TC-34 Experience

24

-Aimé Lay-Ekuakille

	 The Instrumentation and Measurement Society Technical 	
Committee TC-37: Measurements and Networking

27

-Domenico Capriglione

Beverly Lindeen
blindeen@allenpress.com

	

advertising sales manager

Overview of IEEE Technical Committee 41	

Credit: IEEE Instrumentation & Measurement
Society

34

-John Jendzurski

Douglas Swindler
Project Manager, Naylor Association Solutions
+1352-333-3481
DSwindler@naylor.com

To all Companies, please send your
"New Products" information for possible
inclusion in the IEEE I&M Magazine to:
Robert M. Goldberg
1360 Clifton Ave. PMB 336
Cifton, NJ 07012, USA
E-mail: r.goldberg@ieee.org

18

-Martin Nowak, Anthony Beninati, Nicolas Douard, and George C. Giakos

managing editor

on the cover:

14

columns
	

Editorial	2

	

Guest Editorial	

3

departments
	

Calendar	36

	

Society Officers	

41

IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE: (ISSN 1094-6969) (IIMMF9) is published bimonthly by The Institute of Electrical and Electronics Engineers, Inc. Headquarters: 3 Park Avenue, 17th Floor, New York, NY 10016-5997 +1 212 419 7900. Responsibility for the contents rests upon
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November 2020	

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Instrumentation & Measurement Magazine 23-8

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