Instrumentation & Measurement Magazine 23-8 - 1
contents
table of
November 2020 VOL. 23, NO. 8
Instrumentation
& Measurement
I&M society web site
features
http://imm.ieee-ims.org
4
Impedance Spectroscopy: From Laboratory
Instrumentation to Field Sensors
I&M magazine web site
-Olfa Kanoun
http://ieee-ims.org/publications/im-magazine
editor-in-chief
Bruno Andò
Associate Professor
DIEEI - University of Catania
Catania, Italy
bruno.ando@unict.it
8
The Documentary Standards of the
IEEE Technical Committee 10
-Sergio Rapuano, John Jendzurski, Luca De Vito, Steven J. Tilden,
William B. Boyer, and Nicholas G. Paulter, Jr.
associate editor-in-chief
Wendy Van Moer
wendy.w.vanmoer@ieee.org
TC-13 -Wireless and Telecommunications in
Measurements- in Action
senior editorial assistant
-Octavian Postolache and Octavia A. Dobre
Kristy Virostek
virostek5@verizon.net
I&M editorial board
Bruno Andò
Wendy Van Moer
Max Cortner
Salvo Baglio
Shervin Shirmohammadi
Mark Yeary
Kristen Donnell
Ruqiang Yan
Chi Hung Hwang
Veronica Scotti
Charles Nader
Lee Barford
Kevin Bennet
Richard Davis
Polarimetric Dynamic Vision Sensor p(DVS) Principles
Needing Measurements and Instrumentation within the
Nanotechnology World: IEEE IMS TC-34 Experience
24
-Aimé Lay-Ekuakille
The Instrumentation and Measurement Society Technical
Committee TC-37: Measurements and Networking
27
-Domenico Capriglione
Beverly Lindeen
blindeen@allenpress.com
advertising sales manager
Overview of IEEE Technical Committee 41
Credit: IEEE Instrumentation & Measurement
Society
34
-John Jendzurski
Douglas Swindler
Project Manager, Naylor Association Solutions
+1352-333-3481
DSwindler@naylor.com
To all Companies, please send your
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18
-Martin Nowak, Anthony Beninati, Nicolas Douard, and George C. Giakos
managing editor
on the cover:
14
columns
Editorial 2
Guest Editorial
3
departments
Calendar 36
Society Officers
41
IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE: (ISSN 1094-6969) (IIMMF9) is published bimonthly by The Institute of Electrical and Electronics Engineers, Inc. Headquarters: 3 Park Avenue, 17th Floor, New York, NY 10016-5997 +1 212 419 7900. Responsibility for the contents rests upon
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Instrumentation & Measurement Magazine 23-8
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