Instrumentation & Measurement Magazine 24-2 - 71

[71]	C.-H. Chen and M. J. Deen, " A general noise and s-parameter

[74]	C.-H. Chen and M. J. Deen, " Channel noise modeling of deep sub-

de-embedding procedure for on-wafer high-frequency noise

micron MOSFETs, " IEEE Trans. Electron. Device, vol. 49, no. 8, pp.

measurements of MOSFETs, " IEEE Trans. Microwave Theory Tech.,

1484-1487, Aug. 2002.

vol. 49, no. 5, pp. 1004-1005, May 2001.
[72]	C.-H. Chen, R. Lee, G. Tan, D. C. Chen, P. Lei, and C. S. Yeh,
" Equivalent sheet resistance of intrinsic noise in sub-100nm
MOSFETs, " IEEE Trans. Electron. Devices, vol. 59, no. 8, pp. 22152220, Aug. 2012.
[73]	X. Chen, C.-H. Chen, and R. Lee, " Fast evaluation of channel
noise in nanoscale MOSFETs for mixed-signal applications, " IEEE
Trans. Electron. Devices, vol. 65, issue 4, pp. 1502-1509, Apr. 2018.

April 2021	

Chih-Hung Chen (chench@mcmaster.ca) Ph.D., P.Eng (S'95-
M'03-SM'08) is an Associate Professor with the Department
of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada. His current research interests
include the noise characterization of nanoscale semiconductor transistors and instrumentation for thermal noise
measurements.

IEEE Instrumentation & Measurement Magazine	71


http://www.ati-ia.com

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