Instrumentation & Measurement Magazine 25-1 - 69
Metasurface Near-Field
Measurements with Incident
Field Reconstruction Using a
Single Horn Antenna
Ville Tiukuvaara, Kan Wang, Tom J. Smy, and Shulabh Gupta
M
etasurfaces (MSs) are the 2-D equivalent of metamaterials,
the latter being a class of artificial
engineered materials exhibiting peculiar electromagnetic
properties [1], [2]. Generally constructed as arrays
of deeply sub-wavelength resonant particles on a substrate,
the geometry of the particles can be carefully designed to produce
transformations of incident waves, including control of
phase, amplitude, polarization, and direction of propagation.
Recently, a major research direction has been the " intelligent "
Metasurface (MS), where the wave transformation can be electrically
controlled, which could be a viable means of achieving,
in 5G and future wireless communications, the goal of manipulating
and optimizing the propagation environment [3] or to
even create sophisticated illusions and holograms on the fly
[4]. Other topics that have recently been studied are surfaces
with time-varying properties [5] and surfaces composed of
particles with multipolar moments [6].
Such MSs are generally designed with a combination of
simulations and models such as equivalent circuits or surface
susceptibilities. These allow the designer to quickly calculate
the scattered electric fields, given an incident field. Following
fabrication, there are multiple approaches to the characterization
of the MS, depending on the quantities which are desired.
If the scattered far-fields are desired, an angular scan can be
performed in an anechoic chamber. On the other hand, if the
complex electric field distribution next to the metsurface is desired,
it can be probed using a near-field scanning system, as
depicted in Fig. 1a [7]. In the context of MSs, such a system
works by illuminating the MS with an incident field
E xz,
i
generated with a fixed antenna (Tx) with its aperture placed
at
xz,
ap ap . The transmitted fields next to the MS, E xz,
t
xz,rx rx
,
are probed with a waveguide probe antenna (Rx) which can
perform a scan along a line, plane, or volume and record the
field at a collection of points
. Absorbing material is
installed to prevent unwanted reflections for an accurate characterization
of the MS, and can also be installed adjacent to
the surface to eliminate diffraction around the edges, as depicted
in Fig. 1a. An example of such a system used by the
Fig. 1. Near-field system for transmissive metasurface characterization. (a) Schematic; (b) Near-field system at Carleton University.
February 2022
IEEE Instrumentation & Measurement Magazine
1094-6969/22/$25.00©2022IEEE
69
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