Table 3 - Test time estimation for conventional method (IP Power) Sweep time Total points 1 2 5 20 25 1001 1001 1001 1001 1001 No. of points within 0.2 dB 878 902 892 978 1001 No. of points outside 0.2 dB 123 99 109 23 time (IO Transfer Curve + OP Power and Gain) for the developed method is provided as follows: ◗ VNA sweep time: 1 second (for 1 kHz IF bandwidth) ◗ Input/output channel recall time: 6 seconds ◗ Power measurement time: 3 seconds Table 4 compares the ATS measurement time for both systems for all parameters. As mentioned previously, the comparison is for a DUT bandwidth of 250 MHz. However, the overall time is also governed by measurement frequency span (for some parameters). The table shows that there is an almost 50% reduction in the test time. For a typical 12-channel Ku- and C-band transponders consisting of around 200 configurations, the throughput (in hours) will be approximately 34 hours for the Rack and Stack Method and about 8.2 hours for the VNA method deploying parallel ATS system. Table 4 - ATS measurement time requirement Parameter Noise Floor OP Power & Gain IO Transfer Curve Gain Flatness (Frequency Response) Group Delay 3rd order IMD Noise Figure Frequency Translation Errorhttps://www.tesat.de/ https://www.thalesgroup.com/en/global/activities/space https://www.thalesgroup.com/en/global/activities/space https://www.avionteq.com/IFR-Aeroflex-7700-Integrated-Microwave-Test-Solution https://www.avionteq.com/IFR-Aeroflex-7700-Integrated-Microwave-Test-Solution https://www.textronsystems.com/products/wavecore-products https://www.textronsystems.com/products/wavecore-products https://www.textronsystems.com/products/wavecore-products https://atos.net/wp-content/uploads/2017/12/cc-B-RF-TestSystem-R01.1-EN-hires.pdf https://atos.net/wp-content/uploads/2017/12/cc-B-RF-TestSystem-R01.1-EN-hires.pdf