Instrumentation & Measurement Magazine 25-8 - 1

Instrumentation
& Measurement
contents
features
table of
November 2022 VOL. 25, NO. 8
I&M society web site
https://ieee-ims.org/
I&M magazine web site
https://ieee-ims.org/publication/ieee-imm
editor-in-chief
Bruno Andò
Associate Professor
DIEEI - University of Catania, Italy
bruno.ando@unict.it
guest editor
Marco Parvis, marco.parvis@polito.it
associate editors
Wendy Van Moer, wendy.w.vanmoer@ieee.org
Vedran Bilas, vedran.bilas@fer.hr
Domenico Capriglione, capriglione@unicas.it
I&M editorial board
Bruno Andò
Wendy Van Moer
Max Cortner
Salvo Baglio
Shervin Shirmohammadi
Juan Manuel Ramirez-Cortes
Sebastian Yuri C. Catunda
George Xiao
Sergio Rapuano
Marco Parvis
Ruqiang Yan
Lee Barford
Ferdinanda Ponci
Veronica Scotti, Legal Representative
senior editorial assistant
Kristy Virostek
virostek5@verizon.net
managing editor
Jonathan Lantz
jlantz@allenpress.com
advertising sales manager
Aviva Rothman
Project Manager, Naylor Association Solutions
arothman@naylor.com
on the cover:
Credit: IEEE Instrumentation & Measurement
Society
Please send your " New Products " information
for possible inclusion to:
Robert M. Goldberg
E-mail: r.goldberg@ieee.org
Editorial
2
For Safer Approach Landing of the Aircraft: Measuring 26
the Electromagnetic Interference of High-Speed Train
to ILS and Giving Protection Recommendations
-Hede Lu, Fulong Xu, Qianying Wang, Zhida Chen, and Qiang Zhang
An Improved Thru-Line De-Embedding Technique 32
up to 80 GHz
-Shirong Lv, Fusheng Tang, Mingqi Jiao, Shengli Zhang and Liang Xie
columns
Guest Editorial
3
TC List
4
Calendar 38
departments
Society Officers 39
IMS Technical Committee TC-3: Condition Monitoring 5
and Fault Diagnosis Instrument
-Weihua Li and Xuefeng Chen
TC-09 Subcommittee: Capacitive Sensors 10
-Markus Neumayer, Thomas Bretterklieber and Hannes Wegleiter
The IEEE Technical Committee 10-The Waveform 16
Generation, Measurement, and Analysis
Committee: Update 2021
-Luca De Vito, John Jendzurski, Sergio Rapuano, William B. Boyer,
Jerome Blair, and Nicholas G. Paulter, Jr.
TC-25: The Latest Activities of Technical Committee 19
on Biological and Medical Measurements
-Sabrina Grassini and Sergio Rapuano
Technical Committee on Fault Tolerant Measurement 21
Systems
-Ye Chow Kuang, Lorenzo Ciani, and Melanie Ooi
TC-37 Measurements and Networking 23
-Domenico Capriglione
IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE: (ISSN 1094-6969) (IIMMF9) is published electronically nine times per year by The Institute of Electrical
and Electronics Engineers, Inc. (IEEE). IEEE Corporate Office, 3 Park Avenue, 17th Floor, New York, NY 10016-5997. The views expressed in this publication reflect
those of the authors and may not necessarily be those of IEEE, the IEEE Society sponsoring this publication, or its members. Abstracting is permitted with credit
to the source. Permission to reuse the articles in this volume, may be made on an individual article basis by accessing RightsLink by clicking on the blue copyright
symbol (©) from the article's abstract page in the IEEE Xplore library. Additional assistance regarding permission for reuse may be directed to pubs-permissions@
ieee.org. Copyright © 2022 All rights reserved.
November 2022
IEEE Instrumentation & Measurement Magazine
1
https://ieee-ims.org/ https://ieee-ims.org/publication/ieee-imm

Instrumentation & Measurement Magazine 25-8

Table of Contents for the Digital Edition of Instrumentation & Measurement Magazine 25-8

Instrumentation & Measurement Magazine 25-8 - Cover1
Instrumentation & Measurement Magazine 25-8 - Cover2
Instrumentation & Measurement Magazine 25-8 - 1
Instrumentation & Measurement Magazine 25-8 - 2
Instrumentation & Measurement Magazine 25-8 - 3
Instrumentation & Measurement Magazine 25-8 - 4
Instrumentation & Measurement Magazine 25-8 - 5
Instrumentation & Measurement Magazine 25-8 - 6
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Instrumentation & Measurement Magazine 25-8 - 8
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Instrumentation & Measurement Magazine 25-8 - Cover3
Instrumentation & Measurement Magazine 25-8 - Cover4
https://www.nxtbook.com/allen/iamm/26-2
https://www.nxtbook.com/allen/iamm/26-1
https://www.nxtbook.com/allen/iamm/25-9
https://www.nxtbook.com/allen/iamm/25-8
https://www.nxtbook.com/allen/iamm/25-7
https://www.nxtbook.com/allen/iamm/25-6
https://www.nxtbook.com/allen/iamm/25-5
https://www.nxtbook.com/allen/iamm/25-4
https://www.nxtbook.com/allen/iamm/25-3
https://www.nxtbook.com/allen/iamm/instrumentation-measurement-magazine-25-2
https://www.nxtbook.com/allen/iamm/25-1
https://www.nxtbook.com/allen/iamm/24-9
https://www.nxtbook.com/allen/iamm/24-7
https://www.nxtbook.com/allen/iamm/24-8
https://www.nxtbook.com/allen/iamm/24-6
https://www.nxtbook.com/allen/iamm/24-5
https://www.nxtbook.com/allen/iamm/24-4
https://www.nxtbook.com/allen/iamm/24-3
https://www.nxtbook.com/allen/iamm/24-2
https://www.nxtbook.com/allen/iamm/24-1
https://www.nxtbook.com/allen/iamm/23-9
https://www.nxtbook.com/allen/iamm/23-8
https://www.nxtbook.com/allen/iamm/23-6
https://www.nxtbook.com/allen/iamm/23-5
https://www.nxtbook.com/allen/iamm/23-2
https://www.nxtbook.com/allen/iamm/23-3
https://www.nxtbook.com/allen/iamm/23-4
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