Instrumentation & Measurement Magazine 25-8 - 17

about static testing for
high-resolution DACs.
The Std 1658 PAR expiration
date is 31 December
2022. Depending on the
progress in finalizing the
draft of the Std 1658 for balloting
and on the balloting
process, it may be necessary
to request an extension
to the PAR.
The revision process for
Fig. 1. Test setup for measuring the input impedance of single-ended stand-alone probe, as described in IEEE Std 16962013,
[7] ©2020 IEEE.
balloting and on the balloting process, it may be necessary to
request an extension to the PAR. Future revisions to the IEEE
Std 1241 may include quantum-based ADC metrology.
The PAR approval date for the digital-to-analog converter
(DAC) standard, IEEE Std 1658-2011, was 14 June 2018. The
1658WG kick-off meeting was held 20 July 2021. Prior to the
kick-off meeting, potential participants were identified and
contacted and a call for participation was announced by the
IEEE-SA. These responses established the 1658WG membership
which comprises about 20 people from around the world.
Eight meetings have been held since the kickoff meeting,
where the draft standard was revised. Meetings have been
held initially monthly. Since February 2022, they have been
moved to twice per month, to speed up the revision process.
The 1658WG decided to revise the draft essentially during the
meetings with some assignments to volunteers on specific aspects
where some of the 1658WG members were more expert.
All meetings, thus far, have been web-based.
Main revisions were made with the aim of generalizing the
DAC architecture terminology and to improve the compliance
of the Std 1658 with the other TC-10 standards. In particular, a
significant revision was made to Clause 1.6 that provides the
DAC background. The major changes to this clause included:
a) improving the general DAC model by including several
DAC architectures; and b) improving the explanation of the
behavior of the DAC, which is supported by new figures. A
new subclause, 4.3.1, was added that provides considerations
November 2022
the circuit probe standard,
IEEE Std 1696-2013, has
not yet started as a kick-off
meeting has not yet been
scheduled. The chair for
the 1696 Working Group
is working with IEEE-SA
to announce a call for participation.
The PAR for the
Std 1696 was approved on
10 February 2021 and has
an expiration date of 31 December
2025. An example
of one of the test set ups described
in IEEE Std 1696 is
shown in Fig. 1.
The TC-10 is currently engaged
in the revision of the Std 1241, Std 1658 and Std 1696. The
TC-10 invites you to participate in these revisions. These standards
are essential for accurate, reproducible, reliable, and communicable
characterization of the performance of these devices, which
supports technology and product advancement, product comparison
and performance tracking, and device calibration and
traceability. The TC-10 continually updates and improves its
existing standards and develops new ones as needed by its stakeholders.
The TC-10 encourages fresh ideas and new perspectives.
If you are interested in the TC-10's work and would like to
join one or more of its subcommittees, please visit the TC-10
home page at http://tc10.ieee-ims.org/tc10-home or its IEEESA
home page at https://sagroups.ieee.org/im-wma-tc10/.
Contact information for the subcommittee chairs can be found
on these web sites.
References
[1] IEEE Standard for Transitions, Pulses, and Related Waveforms, IEEE
Std. 181-2011, Institute of Electrical and Electronics Engineers, 2011.
[2] IEEE Standard for Digitizing Waveform Recorders, IEEE Std. 10572017,
Institute of Electrical and Electronics Engineers, 2017.
[3] IEEE Standard for Terminology and Test Methods for Analog-toDigital
Converters, IEEE Std. 1241-2010, Institute of Electrical and
Electronics Engineers, 2010.
[4] IEEE Standard for Terminology and Test Methods of Digital-to-Analog
Converter Devices, IEEE Std. 1658-2011, Institute of Electrical and
Electronics Engineers, 2011.
IEEE Instrumentation & Measurement Magazine
17

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Instrumentation & Measurement Magazine 25-8

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