Instrumentation & Measurement Magazine 25-8 - 3

guesteditorial
Marco Parvis
T
echnical Committees (TC) are one of the most important
parts of research advancements for all IEEE
societies, and the Instrumentation and Measurement
Society (IMS) is not an exception from this point of view. The
IMS has 23 active TCs, whose subjects range from condition
monitoring to wireless measurements. They were created by
the IMS in response to an area attracting several researchers.
As an example, the last created TC is devoted to measurements
in the radiation and nuclear area.
When an area is no longer attracting researchers, the TC
is closed. Traditionally, the closed TC number is not reused,
and this explains why the last created TC has the number 45.
Should you be interested in the TC list, please go on the IMS
web site at https://ieee-ims.org/technical-committees for full
descriptions. In addition, the contact information for current
TC Co-chairs may be found on page 4 of this issue.
We present this issue of the Instrumentation & Measurement
Magazine to explain to any reader the research types carried
out by the IMS, and we asked all of the TC Chairs to explain
the type of research they are carrying out in their TC. This year,
you will find six research areas corresponding to different TCs.
Listing them in order of TC number, we have details
about the: TC-3 (Condition Monitoring and Fault Diagnosis
Instrument) prepared by Weihua Li, Junbin Chen, and
Xuefeng Chen; TC-09 (Subcommittee Capacitive Sensors)
prepared by Markus Neumayer, Thomas Bretterklieber
and Hannes Wegleiter; TC-10 (Waveform Generation, Measurement,
and Analysis) prepared by Luca De Vito, John
Jendzurski, Sergio Rapuano, William B. Boyer, Jerome Blair,
and Nicholas G. Paulter, Jr.; TC-25 (Biological and Medical
Measurements) prepared by Sabrina Grassini and Sergio
Rapuano; TC-32 (Fault Tolerant Measurement Systems) prepared
by Ye Chow Kuang, Lorenzo Ciani, and Melanie Ooi;
and TC-37 (Measurement and Networking) prepared by Domenico
Capriglione. Other TC updates will follow in future
issues of the Magazine, with the aim of letting you know what
the IMS is doing.
Changing a famous historical sentence used by a former
President of the United States: Ask not what the Instrumentation
and Measurement Society can do for you. Ask what you
can do for the Instrumentation and Measurement Society. If
you are working in a field covered by an already established
TC, contact the Chair of that TC and join it. If you think a TC
in the area you are working is missing, and several researchers
are actively working in the area, contact me and start being
engaged.
Again, we could use an historical sentence, carrying an important
and real message: We need you!
November 2022
IEEE Instrumentation & Measurement Magazine
3
https://ieee-ims.org/technical-committees

Instrumentation & Measurement Magazine 25-8

Table of Contents for the Digital Edition of Instrumentation & Measurement Magazine 25-8

Instrumentation & Measurement Magazine 25-8 - Cover1
Instrumentation & Measurement Magazine 25-8 - Cover2
Instrumentation & Measurement Magazine 25-8 - 1
Instrumentation & Measurement Magazine 25-8 - 2
Instrumentation & Measurement Magazine 25-8 - 3
Instrumentation & Measurement Magazine 25-8 - 4
Instrumentation & Measurement Magazine 25-8 - 5
Instrumentation & Measurement Magazine 25-8 - 6
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Instrumentation & Measurement Magazine 25-8 - 8
Instrumentation & Measurement Magazine 25-8 - 9
Instrumentation & Measurement Magazine 25-8 - 10
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Instrumentation & Measurement Magazine 25-8 - 12
Instrumentation & Measurement Magazine 25-8 - 13
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Instrumentation & Measurement Magazine 25-8 - 19
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Instrumentation & Measurement Magazine 25-8 - 21
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Instrumentation & Measurement Magazine 25-8 - 25
Instrumentation & Measurement Magazine 25-8 - 26
Instrumentation & Measurement Magazine 25-8 - 27
Instrumentation & Measurement Magazine 25-8 - 28
Instrumentation & Measurement Magazine 25-8 - 29
Instrumentation & Measurement Magazine 25-8 - 30
Instrumentation & Measurement Magazine 25-8 - 31
Instrumentation & Measurement Magazine 25-8 - 32
Instrumentation & Measurement Magazine 25-8 - 33
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Instrumentation & Measurement Magazine 25-8 - 38
Instrumentation & Measurement Magazine 25-8 - 39
Instrumentation & Measurement Magazine 25-8 - Cover3
Instrumentation & Measurement Magazine 25-8 - Cover4
https://www.nxtbook.com/allen/iamm/26-2
https://www.nxtbook.com/allen/iamm/26-1
https://www.nxtbook.com/allen/iamm/25-9
https://www.nxtbook.com/allen/iamm/25-8
https://www.nxtbook.com/allen/iamm/25-7
https://www.nxtbook.com/allen/iamm/25-6
https://www.nxtbook.com/allen/iamm/25-5
https://www.nxtbook.com/allen/iamm/25-4
https://www.nxtbook.com/allen/iamm/25-3
https://www.nxtbook.com/allen/iamm/instrumentation-measurement-magazine-25-2
https://www.nxtbook.com/allen/iamm/25-1
https://www.nxtbook.com/allen/iamm/24-9
https://www.nxtbook.com/allen/iamm/24-7
https://www.nxtbook.com/allen/iamm/24-8
https://www.nxtbook.com/allen/iamm/24-6
https://www.nxtbook.com/allen/iamm/24-5
https://www.nxtbook.com/allen/iamm/24-4
https://www.nxtbook.com/allen/iamm/24-3
https://www.nxtbook.com/allen/iamm/24-2
https://www.nxtbook.com/allen/iamm/24-1
https://www.nxtbook.com/allen/iamm/23-9
https://www.nxtbook.com/allen/iamm/23-8
https://www.nxtbook.com/allen/iamm/23-6
https://www.nxtbook.com/allen/iamm/23-5
https://www.nxtbook.com/allen/iamm/23-2
https://www.nxtbook.com/allen/iamm/23-3
https://www.nxtbook.com/allen/iamm/23-4
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