tclist 2022 IEEE IMS Technical Committees TC-1: Nondestructive Evaluation and Industrial Inspection (NDE&II) TC-2: Impedance Spectroscopy TC-3: Condition Monitoring and Fault Diagnosis Instrument Helena Geirnhas Ramos Zheng Liu Olfa Kanoun Xuefeng Chen Wiehua Li TC-4: High Frequency Measurement and Connector Yeou Song (Brian) Lee TC-6: Emerging Technologies in Measurements TC-7: Signals and Systems in Measurement Lordeana Cristaldi Vedran Bilas TC-9: Sensor Technology TC-10: Waveform Generation Measurement and Analysis TC-13: Wireless and Telecommunications in Measurements TC-17: Materials in Measurements TC-18: Environmental Measurements TC-19: Imaging Measurements TC-20: Transportation Systems in Measurements TC-22: Intelligent Measurement Systems TC-25: Medical and Biological Measurements TC-32: Fault Tolerant Measurement Systems TC-34: Nanotechnology in Instrumentation and Measurement TC-37: Measurements and Networking TC-39: Measurements in Power Systems TC-40: Secure and Dependable Measurement TC-41: Traffic Enforcement Technologies TC-42: Photonic Technology in Instrumentation and Measurement TC-45: Radiation and Nuclear Instrumentation and Systems Ruqiang Yan Kang Lee Nick Paulter Bill Boyer Octavia A. Dobre Octavian Postolache Jacob Scharcanski George Giakos Chi Hung Hwang George Giakos Jacob Scharcanski Michalis Zervakis Georg Brasseur Angelo Genovese Mel Siegel Sergio Rapuano Voicu Groza Ye Chow Kuang Aimé Lay-Ekuakille Domenico Capriglione Carlo Muscas Shiyan Hu John Jendzurski Tuan Guo George Xiao Leticia Pibida hgramos@ist.utl.pt zheng.liu@ieee.org olfa.kanoun@etit.tu-chemnitz.de chenxf@mail.xjtu.edu.cn weihualee@gmail.com brian.ys.lee@ni.com loredana.cristaldi@polimi.it vedran.bilas@fer.hr yanruqiang@xjtu.edu.cn Kang.Lee@nist.gov nicholas.paulter@nist.gov wbboyer@sandia.gov odobre@mun.ca opostolache@lx.it.pt jacobs@inf.ufrgs.br george.giakos@manhattan.edu chhwang@itrc.narl.org.tw george.giakos@manhattan.edu jacobs@inf.ufrgs.br michalis@display.tuc.gr georg.brasseur@tugraz.at angelo.genovese@unimi.it mws@cmu.edu rapuano@unisannio.it vgroza@ieee.org ykuang@waikato.ac.nz aime.lay.ekuakille@unisalento.it capriglione@unicas.it carlo@diee.unica.it S.Hu@soton.ac.uk john.jendzurski@nist.gov tuanguo@jnu.edu.cn George.Xiao@nrc-cnrc.gc.ca leticia.pibida@nist.gov Please visit http://ieee-ims.org/technical-committees for more information and descriptions of the Technical Committees and their Subcommittees. 4 IEEE Instrumentation & Measurement Magazine November 2022http://ieee-ims.org/technical-committees