Instrumentation & Measurement Magazine 25-9 - 62

newproducts
Please send all " New Products " information to:
Robert M. Goldberg
1360 Clifton Ave.
PMB 336
Clifton, NJ 07012 USA
e-mail: r.goldberg@ieee.org
New Device Modeling
Software Enables One-Stop
Workflow
Keysight Technologies, Inc. has announced a
new model generator (MG) environment that
increases productivity for semiconductor
device modeling engineers with improved
automation across the entire workflow.
Semiconductor device modeling engineers
require automated tools to create
accurate simulation models and process
design kits (PDK) for baseband and radio frequency (RF) integrated
circuit (IC) designs that leverage both silicon (CMOS)
and compound III-V technologies.
To address the growing needs of device modeling engineers,
Keysight's device modeling 2023 software suite includes:
◗ PathWave Device Modeling: (IC-CAP) 2023 features the
MG, a new modeling flow manager that enables a oneclick
import of measured data, creation of trend plots,
organization of the extraction flow, basic QA verification
and documentation. IC-CAP also upgrades Radio
Frequency Gallium Nitride (RF GaN) packages, a wide
bandgap material that offers significant advantages in
high-power RF applications, with support for the latest
Compact Model Coalition (CMC) model versions including
improved extraction flows that account for trapping
and thermal effects.
◗ PathWave Model Builder (MBP) 2023 introduces a new
and exclusive link to Synopsys' PrimeSim™ HSPICE®.
This ultra-fast link enables optimization and tuning without
any speed penalty
and delivers access to
HSPICE features such
as CMC standard
models and VerilogA
compiler for custom
models.
62
◗ PathWave Model QA (MQA) 2023 enhances the new
project template-based workflow with various template
examples including statistical, corner, table and RF.
◗ Advanced Low-frequency Noise Analyzer (A-LFNA)
2023 delivers an integrated and compact measurement
system through support of M9601A PXIe Precision
Source/Measure Unit.
For more information about Keysight's PathWave Device
Modeling solutions, visit http://www.keysight.com.
67 GHz Terminated Switches to Support
5G and Semiconductor Test
Pickering Interfaces has
augmented its 4x-785C
range of SP4T & SP6T microwave
multiplexers with
the addition of 67 GHz
terminated SP4T / SP6T
modules to support the latest
requirements of the 5G
and semiconductor test sectors. The 40-785C (PXI) and 42785C
(PXIe) modules feature internal relay terminations that
can improve signal integrity. Devices feature panel and remote
mount options that enable users to locate the switches at the
most convenient location for their application; remote mount
options occupy a single chassis slot but can control up to three
switches, saving space.
Remote mount options connect each switch to the control
module via a 1.5 M cable providing flexibility in switch
positioning. This reduces the length of RF connections, thus
maximizing performance and minimizing cabling costs.
Chassis slot count is minimized as only 3-slots are required
for a single configuration- or 6-slots for dual panel mount
switch-or just a single slot for the remote mount versions.
Pickering also offers a range of high-quality interconnection
cables to support RF applications.
Find more information at http://www.pickeringtest.com.
BNC Signal Conditioner Solution for all
Piezo-Electric Sensors
Pico Technology has launched a new solution which allows
the use of IEPE (Integrated Electronics Piezo-Electric) sensors
on all data acquisition devices with a 1 MΩ BNC interface. The
TA487 IEPE Signal Conditioner is a simple adaptor that allows
any PicoScope or oscilloscope to capture and measure signals
from a large selection of piezo-electric IEPE sensors, such as
IEEE Instrumentation & Measurement Magazine
December 2022
http://www.keysight.com http://www.pickeringtest.com

Instrumentation & Measurement Magazine 25-9

Table of Contents for the Digital Edition of Instrumentation & Measurement Magazine 25-9

Instrumentation & Measurement Magazine 25-9 - Cover1
Instrumentation & Measurement Magazine 25-9 - Cover2
Instrumentation & Measurement Magazine 25-9 - 1
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Instrumentation & Measurement Magazine 25-9 - 62
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Instrumentation & Measurement Magazine 25-9 - Cover3
Instrumentation & Measurement Magazine 25-9 - Cover4
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