Instrumentation & Measurement Magazine 26-2 - 58

newproducts
Please send all " New Products " information to:
Robert M. Goldberg
1360 Clifton Ave.
PMB 336
Clifton, NJ 07012 USA
e-mail: r.goldberg@ieee.org
Wi-Fi 7 Test Solution for Next
Generation Wireless Devices
Rohde & Schwarz and Broadcom Inc. have
announced the availability of an automated
test solution for Broadcom® Wi-Fi 7 chipsets,
the industry's first Wi-Fi 7 chipsets optimized
for mobile handsets that also support
simultaneous dual-band 2x2 IEEE 802.11becompliant
operation.
The IEEE 802.11be amendment covers WiFi
7 operation in the 2.4 GHz, 5 GHz, and 6
GHz bands. The amendment will govern the extremely high
WLAN throughput needed for advanced applications on mobile
handsets. The advanced 4096 QAM modulation scheme,
wide WLAN channels of 320 MHz available in the 6 GHz band,
as well as the multi-link operation (MLO) are key elements to
realize such high throughput in a mobile handset.
IEEE 802.11be poses several challenges to test and measurement
equipment. The 4096 QAM modulation requires signal
generation capabilities that transmit reference signals with
very low distortion over a bandwidth of up to 320 MHz in addition
to the required analysis bandwidth. Applied MIMO
and MLO schemes also demand high performance and scalable
test solutions. The R&S CMP 180 from Rohde & Schwarz
meets these challenges. The test platform is qualified to characterize
Broadcom Wi-Fi 7 chipsets at the RF level to test error
vector magnitude (EVM), timing measurements and spectrum
emission compliance.
The R&S CMP180 radio
communication tester
enables testing of new
wireless technologies such
as Wi-Fi 6E, Wi-Fi 7 and
many more. Twice as many analyzers (2xVSA), generators
(2xVSG) and RF ports (2x8) enable simultaneous measurements
of technologies and devices in a VSA/VSG single-box
tester.
58
For further information on the R&S CMP180, visit
http://www.rohde-schwarz.com/product/cmp180.
Compact Antenna Test Range (CATR)
Anechoic Chamber
The Anritsu Company
has developed the new
Compact Antenna Test
Range (CATR) Anechoic
Chamber 2 MA8172B configuration
for its New
Radio RF Conformance
Test System ME7873NR
to support 5G millimeter
wave (mmWave) 2 Angle of Arrival (2 AoA) Radio Resource
Management (RRM) tests. Anritsu's MA8172B solution is
unique in the industry as it is based on hybrid of IFF (Indirect
Far Field) and DFF (Direct Far Field) test methodologies and
this helps customer save real estate space. A solution based on
all DFF or IFF will be bulky and expensive. Anritsu helps in
providing value to users by making this new solution lower
cost, smaller footprint, upgradable, and serve multiple test
areas.
Anritsu has developed its MA8172B upgrade model for the
Over-the-Air (OTA) CATR based on its earlier CATR Anechoic
Chamber MA8172A. The new MA8172B reproduces the radiowave
propagation characteristics at communications between
the UE and two base stations in compliance with 3GPP. Moreover,
MA8172B allows user to configure any angle of arrivals
from the two base stations, facilitating a wide range of applications,
including conformance tests and R&D.
The ME7873NR is an automated system for 3GPP TS
38.521/TS 38.533 5G NR RF and RRM tests. In addition to
3GPP FR1 (Sub-6 GHz band), combination with either the
CATR Anechoic Chamber MA8172A or MA8172B supports
tests for all 5G frequency bands, including mmWave FR2.
To learn more, visit http://www.anritsu.com.
Radiation Hardened Plastic Packages for
Semiconductor Products
Texas Instruments has announced an expansion in its portfolio
of space-grade analog semiconductor products in highly
reliable plastic packages for a diverse range of missions. TI
developed a new device screening specification called space
high-grade in plastic (SHP) for radiation-hardened products
and introduced new analog-to-digital converters (ADCs)
IEEE Instrumentation & Measurement Magazine
April 2023
http://www.rohde-schwarz.com/product/cmp180 http://www.anritsu.com

Instrumentation & Measurement Magazine 26-2

Table of Contents for the Digital Edition of Instrumentation & Measurement Magazine 26-2

Instrumentation & Measurement Magazine 26-2 - Cover1
Instrumentation & Measurement Magazine 26-2 - Cover2
Instrumentation & Measurement Magazine 26-2 - 1
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Instrumentation & Measurement Magazine 26-2 - Cover3
Instrumentation & Measurement Magazine 26-2 - Cover4
https://www.nxtbook.com/allen/iamm/26-6
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https://www.nxtbook.com/allen/iamm/instrumentation-measurement-magazine-25-2
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https://www.nxtbook.com/allen/iamm/24-9
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https://www.nxtbook.com/allen/iamm/23-9
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