Instrumentation & Measurement Magazine 26-3 - 58

[7] Y. Yuan, Y. Yang, and Z. Ya, " Research of solar simulation
irradiance non-uniformity measurement, " in Proc. Tenth Int. Conf.
Electron. Meas. Instrum., Aug. 2011
[8] B. Hamadani, " Solar cell performance measurements under
artificial lighting sources, " in Proc. 47th
Conf. (PVSC), Aug. 2020.
IEEE Photovoltaic Specialists
[9] T. O'Donnell, M. Hayes, N. Wang, and B. O'Flynn " Design
considerations sub-mW indoor light energy harvesting for
wireless sensor systems, " ACM J. Emergent Technol. Computer
Syst., Jun. 2010.
[10] A. Nasiri, S. A. Zabalwi, and G. Mandic, " Indoor power
harvesting using photovoltaic cells for low power applications, "
IEEE Trans. Industrial Electron., vol. 56, no. 11, Nov. 2009.
Peter R. Michael (SM'21) (prm@usf.edu) is a Ph.D. Candidate
at the University of South Florida in Tampa, Florida, USA in
the Electrical Engineering Department of the College of Engineering.
He holds a master degree in systems engineering
from Arizona State University, Tempe, Arizona, USA and a B.S.
degree in electrical engineering from the University of Colorado,
Boulder, Colorado, USA. Mr. Michael has over 30 years
of industry experience in systems integration. This work is in
support of his dissertation.
Danvers E. Johnston (djohnston@fgcu.edu) is an Assistant
Professor with the Environmental and Civil Engineering
Department of the Whitaker College of Engineering at Florida
Gulf Coast University in Ft. Myers, Florida, USA. He
earned a Ph.D. degree in physics from the University of Pennsylvania,
Philadelphia, Pennsylvania, USA. His research
interests and expertise, including electronic nanomaterials
and device physics, low-cost thin-film solar cells, and scalable
nanomanufacturing.
Wilfrido A. Moreno (wmoreno@usf.edu) is a Full Professor in
the Electrical Engineering Department of the College of Engineering
at the University of South Florida in Tampa, Florida,
USA, where he earned the Ph.D. degree in electrical engineering.
His research interests are in energy, power electronics, and
controls option supervisor. Primary areas of interest include
system integration for industrial applications in the areas of industrial
controls and instrumentation.
58
IEEE Instrumentation & Measurement Magazine
May 2023

Instrumentation & Measurement Magazine 26-3

Table of Contents for the Digital Edition of Instrumentation & Measurement Magazine 26-3

Instrumentation & Measurement Magazine 26-3 - Cover1
Instrumentation & Measurement Magazine 26-3 - Cover2
Instrumentation & Measurement Magazine 26-3 - 1
Instrumentation & Measurement Magazine 26-3 - 2
Instrumentation & Measurement Magazine 26-3 - 3
Instrumentation & Measurement Magazine 26-3 - 4
Instrumentation & Measurement Magazine 26-3 - 5
Instrumentation & Measurement Magazine 26-3 - 6
Instrumentation & Measurement Magazine 26-3 - 7
Instrumentation & Measurement Magazine 26-3 - 8
Instrumentation & Measurement Magazine 26-3 - 9
Instrumentation & Measurement Magazine 26-3 - 10
Instrumentation & Measurement Magazine 26-3 - 11
Instrumentation & Measurement Magazine 26-3 - 12
Instrumentation & Measurement Magazine 26-3 - 13
Instrumentation & Measurement Magazine 26-3 - 14
Instrumentation & Measurement Magazine 26-3 - 15
Instrumentation & Measurement Magazine 26-3 - 16
Instrumentation & Measurement Magazine 26-3 - 17
Instrumentation & Measurement Magazine 26-3 - 18
Instrumentation & Measurement Magazine 26-3 - 19
Instrumentation & Measurement Magazine 26-3 - 20
Instrumentation & Measurement Magazine 26-3 - 21
Instrumentation & Measurement Magazine 26-3 - 22
Instrumentation & Measurement Magazine 26-3 - 23
Instrumentation & Measurement Magazine 26-3 - 24
Instrumentation & Measurement Magazine 26-3 - 25
Instrumentation & Measurement Magazine 26-3 - 26
Instrumentation & Measurement Magazine 26-3 - 27
Instrumentation & Measurement Magazine 26-3 - 28
Instrumentation & Measurement Magazine 26-3 - 29
Instrumentation & Measurement Magazine 26-3 - 30
Instrumentation & Measurement Magazine 26-3 - 31
Instrumentation & Measurement Magazine 26-3 - 32
Instrumentation & Measurement Magazine 26-3 - 33
Instrumentation & Measurement Magazine 26-3 - 34
Instrumentation & Measurement Magazine 26-3 - 35
Instrumentation & Measurement Magazine 26-3 - 36
Instrumentation & Measurement Magazine 26-3 - 37
Instrumentation & Measurement Magazine 26-3 - 38
Instrumentation & Measurement Magazine 26-3 - 39
Instrumentation & Measurement Magazine 26-3 - 40
Instrumentation & Measurement Magazine 26-3 - 41
Instrumentation & Measurement Magazine 26-3 - 42
Instrumentation & Measurement Magazine 26-3 - 43
Instrumentation & Measurement Magazine 26-3 - 44
Instrumentation & Measurement Magazine 26-3 - 45
Instrumentation & Measurement Magazine 26-3 - 46
Instrumentation & Measurement Magazine 26-3 - 47
Instrumentation & Measurement Magazine 26-3 - 48
Instrumentation & Measurement Magazine 26-3 - 49
Instrumentation & Measurement Magazine 26-3 - 50
Instrumentation & Measurement Magazine 26-3 - 51
Instrumentation & Measurement Magazine 26-3 - 52
Instrumentation & Measurement Magazine 26-3 - 53
Instrumentation & Measurement Magazine 26-3 - 54
Instrumentation & Measurement Magazine 26-3 - 55
Instrumentation & Measurement Magazine 26-3 - 56
Instrumentation & Measurement Magazine 26-3 - 57
Instrumentation & Measurement Magazine 26-3 - 58
Instrumentation & Measurement Magazine 26-3 - 59
Instrumentation & Measurement Magazine 26-3 - 60
Instrumentation & Measurement Magazine 26-3 - 61
Instrumentation & Measurement Magazine 26-3 - Cover3
Instrumentation & Measurement Magazine 26-3 - Cover4
https://www.nxtbook.com/allen/iamm/26-6
https://www.nxtbook.com/allen/iamm/26-5
https://www.nxtbook.com/allen/iamm/26-4
https://www.nxtbook.com/allen/iamm/26-3
https://www.nxtbook.com/allen/iamm/26-2
https://www.nxtbook.com/allen/iamm/26-1
https://www.nxtbook.com/allen/iamm/25-9
https://www.nxtbook.com/allen/iamm/25-8
https://www.nxtbook.com/allen/iamm/25-7
https://www.nxtbook.com/allen/iamm/25-6
https://www.nxtbook.com/allen/iamm/25-5
https://www.nxtbook.com/allen/iamm/25-4
https://www.nxtbook.com/allen/iamm/25-3
https://www.nxtbook.com/allen/iamm/instrumentation-measurement-magazine-25-2
https://www.nxtbook.com/allen/iamm/25-1
https://www.nxtbook.com/allen/iamm/24-9
https://www.nxtbook.com/allen/iamm/24-7
https://www.nxtbook.com/allen/iamm/24-8
https://www.nxtbook.com/allen/iamm/24-6
https://www.nxtbook.com/allen/iamm/24-5
https://www.nxtbook.com/allen/iamm/24-4
https://www.nxtbook.com/allen/iamm/24-3
https://www.nxtbook.com/allen/iamm/24-2
https://www.nxtbook.com/allen/iamm/24-1
https://www.nxtbook.com/allen/iamm/23-9
https://www.nxtbook.com/allen/iamm/23-8
https://www.nxtbook.com/allen/iamm/23-6
https://www.nxtbook.com/allen/iamm/23-5
https://www.nxtbook.com/allen/iamm/23-2
https://www.nxtbook.com/allen/iamm/23-3
https://www.nxtbook.com/allen/iamm/23-4
https://www.nxtbookmedia.com