Evaluation Engineering - 12
INSTRUMENTATION
market continues to grow because there
are some test resources that just won't
fit in a PXI Chassis. Take for example, a
1000-watt power supply in an 18-slot PXI
chassis-it's just not practical. Some test
resources can't go into a modular standard
that was not designed to accommodate
such high-power applications. But remember, many power supply vendors produce
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12
EVALUATION ENGINEERING MAY 2019
power supplies with plug-in modules based
on a proprietary modular standard to allow
for custom configurations. In other areas of
LXI Instruments, there is still a huge market
for full-featured instruments that can be
used manually with front panel controls as
well as being controlled by an LXI interface."
Now on the market
Here's the recent solutions vendors told
EE that the modular instrument market
should have top-of-mind.
Recent solution introductions out of
Marvin Test Solutions include additions to its GENASYS switching product
line, with the GX6188 and a new, highperformance user-programmable FPGA
module-the GX3800e-which supports
the industry standard FMC interface and
enables end users to easily create specialized instrumentation by employing
off-the-shelf, commercial FMC modules.
Upcoming July 9-11 at SEMICON West,
MTS will exhibit its PXI-based TS960e
semiconductor test system and TS-900
for MEMS testing.
Along with Pickering's aforementioned 2- and 4-slot LXI and LXI/USB
Modular Chassis, the company's other
recently-introduced modular instruments include a new family of PXI programmable resisters (40-251/2/3); a
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Evaluation Engineering
Table of Contents for the Digital Edition of Evaluation Engineering
Editorial: The Current State of 5G Wireless Service
By the Numbers
Industry Report
Modular Instruments: Amid 5G and IIoT's evolution, demand for modular instrumentation hits new heights
Cybersecurity: How vendors are shielding against the dark side
Memory: What is NVMe-oF interop testing and why is it important?
Semiconductor Test: 1000A high-current RDSon static parameter DC testing vs. pulse testing at 300µs
EE's Sights from APEC 2019
Tech Focus
Featured Tech
Industrial Internet of Things - IIoT 2019: The industrial Revolution keeps on ticking
Evaluation Engineering - Cover1
Evaluation Engineering - Cover2
Evaluation Engineering - 1
Evaluation Engineering - 2
Evaluation Engineering - 3
Evaluation Engineering - By the Numbers
Evaluation Engineering - 5
Evaluation Engineering - Industry Report
Evaluation Engineering - 7
Evaluation Engineering - Modular Instruments: Amid 5G and IIoT's evolution, demand for modular instrumentation hits new heights
Evaluation Engineering - 9
Evaluation Engineering - 10
Evaluation Engineering - 11
Evaluation Engineering - 12
Evaluation Engineering - 13
Evaluation Engineering - Cybersecurity: How vendors are shielding against the dark side
Evaluation Engineering - 15
Evaluation Engineering - Memory: What is NVMe-oF interop testing and why is it important?
Evaluation Engineering - 17
Evaluation Engineering - Semiconductor Test: 1000A high-current RDSon static parameter DC testing vs. pulse testing at 300µs
Evaluation Engineering - 19
Evaluation Engineering - 20
Evaluation Engineering - 21
Evaluation Engineering - EE's Sights from APEC 2019
Evaluation Engineering - 23
Evaluation Engineering - 24
Evaluation Engineering - 25
Evaluation Engineering - Tech Focus
Evaluation Engineering - 27
Evaluation Engineering - Featured Tech
Evaluation Engineering - 29
Evaluation Engineering - 30
Evaluation Engineering - 31
Evaluation Engineering - Industrial Internet of Things - IIoT 2019: The industrial Revolution keeps on ticking
Evaluation Engineering - Cover3
Evaluation Engineering - Cover4
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