Antenna Systems & Technology - Fall 2013 - (Page 23)
TEST & MEASUREMENT
NEW PRODUCTS & SERVICES
Test Base Station Antenna on Your Lab Bench
Due to the time and cost constraints of conducting far-field measurements of base station antennas many mobile service providers
cannot afford to measure the antennas as much as they would like.
Directly testing far-field in an anechoic chamber is not appropriate
because of the large distances required for the far-field to establish.
Outdoor test sites can be difficult to find and their use is constrained
by weather. Specific chambers for testing large antennas using specialized techniques are required. In addition, many base station
antennas have mechanical adjustments which alter the pattern of
the array creating a need for measurement with multiple setups.
EMSCAN’s RFX2 is a desktop scanner that characterizes antennas
without the need for a chamber. RFX2 provides far-field patterns, bisections, EIRP and TRP in less than two
seconds. Novel near-field results, including amplitude, polarity and phase give insights into the root causes
of antenna performance challenges and help troubleshoot far-field radiation patterns.
RFX2 can also integrate with a network analyzer to measure gain, efficiency and S11 of an antenna, and
with a base station emulator to test cell phones. Users can execute real-time analysis of their embedded
antenna designs and test multiple design iterations, on the lab bench, in seconds at each stage of the
design process. RFX2 also gives wireless engineers the freedom to do rapid prototyping and explore new
designs, materials and forms. Wireless engineers and designers can test multiple design variations and
optimize complex embedded antenna designs at their desktop in seconds without wasting time waiting in
congested anechoic chamber lines.
Signal Analyzers Offer Improved
Phase-Noise Performance, Sweep Speed
Agilent Technologies, Inc. has announced greater
core performance in two of its X-Series signal analyzers, the midrange MXA and general-purpose EXA.
The respective improvements in phase noise allow
engineers to more precisely characterize the frequency stability of oscillators and synthesizers. The
faster sweep speeds of these analyzers accelerate
searches for spurious signals in the testing of transmitters, active antenna arrays and power amplifiers.
Phase-noise performance is a key factor in obtaining low and accurate error vector magnitude values for
communication systems and devices. In the MXA, phase noise has been improved by 10 dB or more for
close-in and pedestal offset frequencies, providing an advantage of 7 dB over the closest comparable competitor. EXA phase-noise performance is up to 5 dB better across wide offset frequencies.
In manufacturing test, spur searches in wide spans at narrow resolution bandwidths have been slow and
are often the cause of bottlenecks. The new “fast sweep” capability of these analyzers is up to five times
faster than that of competitive models, depending on resolution bandwidth. Faster sweeps improve measurement throughput and make it easier to check the spurious-free dynamic range of devices under test.
“The MXA enhancements are an important complement to our recently introduced options for 160-MHz
analysis bandwidth and real-time spectrum analysis,” said Jim Curran, marketing manager of Agilent’s Microwave Communications Division. “Together, these capabilities can help our customers ensure that their
devices will transmit accurately and deliver excellent quality of service.”
For test & measurement, visit www.antennasonline.com/main/category/markets/test-measurement
Fall 2013 Antenna Systems & Technology
Table of Contents for the Digital Edition of Antenna Systems & Technology - Fall 2013
Exponential M2M Market Growth Calls for Innovative RF and Antenna Solutions
Managing Distributed Antenna Systems Effectively and Efficiently
Millimeter Wave Antenna Radome Systems for Satellite on the Move Applications
Test & Measurement
Antenna Systems 2013: Conference Preview
Addressing Customer Requirements in Public Safety Antennas
Antenna Systems & Technology - Fall 2013