EDNE June 2012 - (Page 4)
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d e pa r t m e n t s & Columns
9 EDN.comment: Life in the fast lane 18 Test & Measurement World: Bridge software and hardware to accelerate SOC validation
by Brad Quinton, Tektronix
Controller ICs take multitouch screens beyond smartphones
32
As multitouch touchscreens move beyond smartphones and tablets into automotive, medical, and instrumentation applications, their features evolve to fit lower prices and varying form factors. by Margery Conner, Senior Technical Editor
Pico-projector design uses color LEDs
41
An LED light source uses a flexible chip and package platform for color-sequential embedded pico projection. by Francis Nguyen and Stefan Morgott, Osram Opto Semiconductors
31 Baker’s Best: EMI problems? Part three: strength of EMI-radiated signals 50 Mechatronics in design: The significance of poles and zeros 52 Teardown: What’s inside the Samsung 40W-replacement-LED light? 60 Tales from the cube: Pulp packs a punch
Test-driven development for embedded C: Why debug?
Test-driven development helps you improve schedule predictability and product quality by eliminating bugs before they make the bug list. by James W Grenning, Renaissance Software Consulting
Digital isolation in smart energy metering applications
In applications such as smart energy meters that require isolation, digital isolators with isolated power technology combined with shunt resistors offer a solution. by Petre Minciunescu and Brian Kennedy, Analog Devices
26
46
produCt roundup
58 Data conversion; Embedded quad-cores
Cover image: ThinkSToCk/giULia Fini-gULoTTa
DesigniDeas
53 Convert 1 to 5V signal to 4- to 20-mA output
5V 1 nF GP2D120 100 F + VS ≃50 + – 33k 100 nF 500 56k VIN=0 TO 1V DC 2.2k 3 2 5 8 MHz EXTAL PC0-7 8 D0-7 6 4 AD654 1 7 8 10k MC68HC11 T PA0 XTAL PB7 PB6 PB5 LCD E RS R/W
54 Linearize optical distance sensors with a voltage-to-frequency converter 56 RC-timed shutoff function uses op amp and momentary switch 57 Use an integrator instead of coupling capacitors
4 EDN EUROPE | JUNE 2012
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Table of Contents for the Digital Edition of EDNE June 2012
Cover
Agilent Technologies
Contents
International Rectifier
RS Components
Masthead
International Rectifier
Comment
Pulse
Analog Devices
Digi-Key
Farnell
NXP
Test & Measurement
Silicon Labs
Digi-Key
Test-driven development for embedded C: why debug?
Digi-Key
Baker’s best
Cover story
Rohde & Schwarz
Rohde & Schwarz
Rohde & Schwarz
Rohde & Schwarz
Rohde & Schwarz
Pico-projector design uses color LEDs
Digital isolation in smart energy metering applications
Mechatronics in design
Teardown
Design Idea
Product Roundup
Tales from the cube
EDNE June 2012
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