Aerospace & Defense Technology - February 2021 - 33

Tech Briefs

tic of the device (e.g., resonance properties of a resonator or the transfer
function of a filter) can be studied.
On the optoelectronic side, the electronic signal for modulating, tuning, or
controlling the optical signal comes
from a fast arbitrary wave generator
(AWG) and it is applied to the photonic
structure after the amplification by a 30
dBm power amplifier through the high
speed (50 GHz) probes as shown. The
output optical signal of the nanophotonic (or plasmonic) is measured by first
amplifying the optical signal using a
low-noise optical semiconductor amplifier and then detected by a high-speed
(50 GHz) detector. Finally, the output
signal is sampled and detected using a
high-speed sampling oscilloscope (60
GS/s), which can provide time-domain
and spectral information such as eye diagram and spectral transfer function of
the device.
The testbed shown can also be used
to characterize the electronic properties
(e.g., current-voltage characteristics, resistance measurement, and capacitance
measurement) of the integrated structures using the source measurement
unit (SMU). Such measurements are
very important in working with emerging materials such as graphene where
the electronic properties (e.g., conductivity) have profound effects on the optoelectronic characteristics of the device
(e.g., modulation speed of a photonic
modulator). The electronic characterization is performed by using two highspeed probes for applying the desired
voltage and measuring the resulting
current.
The developed testbed enables the
characterization of different electronic,
(passive) photonic, and (active) optoelectronic properties of an integrated
optoelectronic device/system.
The implemented high-speed characterization setup provides a high flexibility that can be used for different
characterization configurations for different optoelectronic devices. The high
flexibility of the proposed testbed,
along with the ability to excite and detect the signals at very high speeds,
make the proposed testbed a unique
tool that can facilitate the study of several state-of-the-art integrated pho-

tonic structures that are of high demand for DoD applications. In addition, the proposed testbed can be utilized for the characterization of a large
variety of electronic and photonic
structures beyond integrated optoelectronic system.

Aerospace & Defense Technology, February 2021

This work was done by Ali Adibi Ph.D. of
Georgia Tech Research Corporation for the
Army Research Office. For more information, download the Technical Support
Package (free white paper) at www.
aerodefensetech.com/tsp under the Electronics & Software category. ARL-0234

Free Info at http://info.hotims.com/79410-786

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http://www.aerodefensetech.com/tsp http://info.hotims.com/79410-786 http://www.abpi.net/ntbpdfclicks/l.php?202102ADTNAV

Aerospace & Defense Technology - February 2021

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