Instrumentation & Measurement Magazine 25-7 - 31

[2] G. L. Amorese, " Reducing ESR measurement errors, " Microwaves
and RF, vol. 42, no. 4, pp. 75-80, Apr. 2003.
[3] B. Walker, " Make accurate impedance measurements, "
Microwaves and RF, vol. 58, no. 7, pp. 28-34, Jul. 2019.
[4] K. Kurokawa, " Power waves and the scattering matrix, " IEEE
Trans. Microw. Theory Tech., vol. 13, pp. 194-202, Mar. 1965.
[5] " S parameters design, " Keysight, Application Note 154, Apr.
1972.
[6] " In fixture measurements using vector network analyzers, "
AN1287-9, Keysight.
[7] " Specifying calibration standards for the HP 8510 network
analyzer, " PN8510-5A, Keysight.
Fig. 6. Screen plot of the S21
parameter of a 100 pF ultra high-Q capacitor,
measured with the shunt insertion mode.
this dilemma can be solved with the preceding result given by
the reflection technique whose accuracy is sufficient for telling
if the impedance to be measured has a low or a high value.
If the impedance is low, then the shunt insertion mode is selected;
conversely, it is the serial insertion mode that must be
used. Finally, knowledge of the proper insertion mode allows
the unknown dipole to be measured, and depending on the
selected insertion mode, the dipole's impedance may be computed
with (10) or (12).
References
[1] Standard Test Method for Effective Series Resistance (ESR) and
Capacitance of Multilayer Ceramic Capacitors at High Frequencies,
American Society for Testing and Materials (ASTM), Standard
F752-82, 1982.
Francis Rodes has been an Assistant Professor with the Bordeaux
Institute of Technology (ENSEIRB-MATMECA)
Graduate School of Engineering in Bordeaux, France since
1983. His research interests include radio frequency circuit
design and biomedical telemetry circuit design. He received
the Dipl.Eng. degree from ENSERB in 1973 and the Ph.D. degree
in electrical engineering from the University of Bordeaux,
France in 1981.
Xavier Hochart has been a Research and Development Engineer
with EXXELIA in Pessac, France since 1997. His research
interests include material developments and Ultra HI-Q capacitor
design, characterization and measurement. He
received the B.S. and M.S. degrees in material sciences (Toulouse,
France) in 1993 and Specialized Master " Materials "
from ENSCPB (Bordeaux, France) in 1997.
[8] F. Rodes, E. Garnier, O. Chevalerias, P. Lourenco de Oliveira:
" Characterize balanced devices with a VNA, " Microwaves and RF,
vol. 44, no. 10, pp. 60-74, Oct. 2005.
October 2022
IEEE Instrumentation & Measurement Magazine
31

Instrumentation & Measurement Magazine 25-7

Table of Contents for the Digital Edition of Instrumentation & Measurement Magazine 25-7

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