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implementation. These provide essential insight for the system engineers, process engineers, and circuit designers to
enhance the performance of their noise measurement systems,
technologies, and circuit designs for low-noise applications.

[17]	C.-H. Chen, Y. L. Wang, M. Bakr, and Z. Zeng, " Novel noise
parameter determination for on-wafer microwave noise
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[18]	S.-C. Wang, P. Su, K.-M. Chen, K.-H. Liao, B.-Y. Chen, S.-Y.

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